| Zugriffsnummer | 56178 |
| Dokumenttyp | Konferenzartikel |
| Sprache | Englisch |
| Titel | Glossary of terms and definitions of digital metrological twins for freeform metrology |
| Autor(in); Institution |
Linkeova, Ivana; CMI Czech Metrology Institute, Prague, CZECHIA
Soukal, Jan; CMI Czech Metrology Institute, Prague, CZECHIA
Janzen, Katharina; 5.3, Koordinatenmesstechnik, PTB-Braunschweig
Wojtowicz, Adam; Central Office of Measures (GUM), Warzawa, POLAND; Cracow University of Technology, Faculty of Mechanical Engineering, POLAND
Czulek, Dariusz; Central Office of Measures (GUM), Warzawa, POLAND
Nouira, Hichem; Laboratoire national de métrologie et d’essais (LNE), Paris, FRANCE
Xhafa, Ermes; Laboratoire national de métrologie et d’essais (LNE), Paris, FRANCE
Bergstrand, Sten; RISE Research Institutes of Sweden AB, SWEDEN
Thore, Andreas; RISE Research Institutes of Sweden AB, SWEDEN
Hanquist, Carl-Henrik; RISE Research Institutes of Sweden AB, SWEDEN
Knulst, Walter; VSL B.V., Delft, THE NETHERLANDS
van Dijk, Marcel; VSL B.V., Delft, THE NETHERLANDS
Nalbantoglu, Devrim; VSL B.V., Delft, THE NETHERLANDS
Kok, Gertjan; VSL B.V., Delft, THE NETHERLANDS
Hemming, Björn; Teknologian tutkimuskeskus VTT Oy, Espoo, FINLAND
Heikkinen, Ville; Teknologian tutkimuskeskus VTT Oy, Espoo, FINLAND
Lassila, Antti; Teknologian tutkimuskeskus VTT Oy, Espoo, FINLAND
Tossello, Guido; Danmarks Tekniske Universitet (DTU), Lyngby, DENMARK
Anwer, Nabil; Ecole Normale Supérieure Paris-Saclay, FRANCE
Puerto, Pablo; IDEKO, Basque Research and Technology Alliance (BRTA), Elgoibar, SPAIN
Garcia Berdote, Asier; IDEKO, Basque Research and Technology Alliance (BRTA), Elgoibar, SPAIN
Gaska, Adam; Cracow University of Technology, Krakow, POLAND
Harmatys, Wiktor; Cracow University of Technology, Krakow, POLAND
Maculotti, Giacomo; Politecnico di Torino, Department of Management and Production Engineering, Torino, ITALY
Galetto, Maurizio; Politecnico di Torino, Department of Management and Production Engineering, Torino, ITALY
Verna, Elisa; Politecnico di Torino, Department of Management and Production Engineering, Torino, ITALY
Genta, Gianfranco; Politecnico di Torino, Department of Management and Production Engineering, Torino, ITALY
Bodenbrenner, Matthias; RWTH Aachen University, WZL-IQS, Aachen, GERMANY
Dang, Yixiang; RWTH Aachen University, WZL-IQS, Aachen, GERMANY
Schmitt, Robert H.; RWTH Aachen University, WZL-IQS, Aachen, GERMANY
Kortaberria, Gorka; Fundacion Tekniker, Eibar, SPAIN
Gomez-Acedo, Eneko; Fundacion Tekniker, Eibar, SPAIN
Mutilba, Unai; Fundacion Tekniker, Eibar, SPAIN
Savio, Enrico; Università degli Studi di Padova, Padua, ITALY
Catalucci, Sofia; Università degli Studi di Padova, Padua, ITALY
Didonè, Lorenzo; Università degli Studi di Padova, Padua, ITALY
Hageney, Jan; eumetron GmbH, Aalen, GERMANY
Pierro, Andreas; eumetron GmbH, Aalen, GERMANY
Paul, Florian; eumetron, Aalen, GERMANY
Maresch, Thomas; Hexagon Metrology GmbH, Wetzlar, GERMANY
Abe, Makoto; Mitutoyo CTL Germany GmbH, Oberndorf am Neckar, GERMANY
Imkamp, Dietrich; Carl Zeiss Industrielle Messtechnik GmbH, GERMANY
Sato, Osamu; National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, JAPAN
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| Quelle/Jahr | Proceedings of the 26th international conference of the european society for precision engineering and nanotechnology, 8th - 12th June 2026, Kraków, PL:(2026), 76 - 79 |
| ISBN | 978-1-9989991-9-4 |
| Konferenzangaben | euspen’s 26th International Conference & Exhibition, Krakow, 08-12, June, 2026, Poland |
| Freie Schlagworte | Digital metrological twin ; freeform metrology ; advanced manufacturing ; coordinate measuring ; freeform surface |
| Zusammenfassung | This paper aims to introduce the “Glossary of terms and definitions of Digital-Metrological Twins (D-MTs) for freeform metrology” (Glossary) compiled for the purposes of the 23IND12 ADAM: Application of Digital-Metrological Twins for emerging measurement technology in advanced manufacturing, a Joint Research Project (JRP) within the European Partnership on Metrology (EPM). The main objective of the Glossary is to unify technical terminology and enable precise and unambiguous communication between partner institutions. A number of ISO standards and scientific papers have been studied in order to select clear and consistent definitions of key terms and concepts that are essential for the correct understanding and implementation of advanced models, methods and technologies used in the field of D-MT freeform metrology. The terms and definitions in the Glossary are accompanied by a number of original images for better understanding, hyperlinks and an alphabetical index for easy navigation. In September 2026, the Glossary will be published on the 23IND12 ADAM project website https://www.adam.ptb.de. |
| Themenbereich der Metrologie | Länge, dimensionelle Metrologie |
| Innovationscluster | Digitalisierung |
| Geschäftsfelder | Metrologie für die Wirtschaft |
| Forschungsprojekt | Application of Digital-Metrological Twins for emerging measurement technology in advanced manufacturing (ADAM) |
| Förderinformationen (1) |
Förderername: European Partnership on Metrology
Förderer ID: 0000 0005 0727 0588 Förderer ID Typ: ISNI Förderprogramm: Horizon Europe Titel der Förderung: Application of Digital-Metrological Twins for emerging measurement technology in advanced manufacturing (ADAM) Förderungsnummer: 23IND12 ADAM URI der Förderung: https://www.metpart.eu |
Zitierung
Linkeova, I., Soukal, J., Heißelmann, D., Janzen, K., Neuschaefer-Rube, U., Frömel, L.-J., Wojtowicz, A., Czulek, D., Nouira, H., Xhafa, E., Bergstrand, S., Thore, A., Hanquist, C.-H., Knulst, W., van Dijk, M., Nalbantoglu, D., Kok, G., Hemming, B., Heikkinen, V., Lassila, A., Tossello, G., Anwer, N., Puerto, P., Garcia Berdote, A., Gaska, A., Harmatys, W., Maculotti, G., Galetto, M., Verna, E., Genta, G., Bodenbrenner, M., Dang, Y., Schmitt, R. H., Kortaberria, G., Gomez-Acedo, E., Mutilba, U., Savio, E., Catalucci, S., Didonè, L., Hageney, J., Pierro, A., Paul, F., Maresch, T., Abe, M., Imkamp, D., & Sato, O. (2026). Glossary of terms and definitions of digital metrological twins for freeform metrology. euspen’s 26th International Conference & Exhibition, Krakow, 08-12, June, 2026, Poland.