| Zugriffsnummer | 56028 |
| Dokumenttyp | Konferenzartikel |
| Sprache | Englisch |
| Titel | Accurate microwave testing of dielectric samples from 15 GHz to 130 GHz using fabry-perot open resonator |
| Autor(in); Institution |
Salski, Bartłomiej; Warsaw University of Technology, Warsaw, POLAND; Central Office of Measures (GUM), Warsaw, POLAND
Wojciechowski, Marcin; Central Office of Measures (GUM), Warsaw, POLAND
Shang, Xiaobang; National Physical Laboratory (NPL), Teddington, UK
Hudlicka, Martin; Czech Metrology Institute (CMI), Prague, CZECH REPUBLIC
|
| Quelle/Jahr | 2026 106th ARFTG Microwave Measurement Conference (ARFTG):(2026), 1 - 4 |
| ISSN | 2767-8776 (online) ; 2836-1407 (print) |
| ISBN | 979-8-3315-9080-2 (online) ; 979-8-3315-9081-9 (PoD) |
| DOI | |
| Verlag | Piscataway, NJ: IEEE |
| Konferenzangaben | 106th ARFTG Microwave Measurement, Los Angeles, CA, 18-21, January, 2026, USA |
| Freie Schlagworte | dielectric constant ; loss tangent ; Fabry-Perot open resonator ; microwaves |
| Zusammenfassung | It will be shown in this paper for the first time in the literature that a Fabry-Perot open resonator can be exploited for accurate microwave testing of dielectric sheets in the 15-130 GHz range in a single run. The unique features of this type of a resonator, like the extremely high Q-factor achievable at Gaussian modes evenly distributed in a broad microwave range, allows measuring losses with a very high accuracy. The advantage of using only one accurate and broadband measurement fixture is invaluable as it allows neglecting all of the errors related to the differences between the tools applied at consecutive frequencies and also those due to finite repeatability of inserting the sample. It will also be shown that owing to the linear polarization of Gaussian modes utilized in the Fabry-Perot open resonator in-plane anisotropy of the samples can be determined even when the thickness is just a few microns. |
| Themenbereich der Metrologie | Elektrizität und Magnetismus |
| Forschungsprojekt | EPM 23IND10 OnMicro |
| Förderinformationen (1) |
Förderername: European Commission (EC)
Förderer ID: 0000 0001 2242 8989 Förderer ID Typ: ISNI Förderprogramm: Metrology Partnership 2023 Industry Titel der Förderung: 23IND10: OnMicro: On-wafer microwave metrology for future industrial applications Förderungsnummer: 23IND10 |
Zitierung
Salski, B., Wojciechowski, M., Phung, G. N., Shang, X., & Hudlicka, M. (2026). Accurate microwave testing of dielectric samples from 15 GHz to 130 GHz using fabry-perot open resonator. 106th ARFTG Microwave Measurement, Los Angeles, CA, 18-21, January, 2026, USA. https://doi.org/10.1109/ARFTG68976.2026.11475005