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Zugriffsnummer 55890
Dokumenttyp Konferenzartikel
Sprache Englisch
Titel Metrological traceability of digitizers for the measurement of high voltage nanosecond pulses
Autor(in); Institution
Agazar, Mohamed; Laboratoire National de Métrologie et d’Essais, Paris, FRANCE
Meisner, Johann; 2.3, Elektrische Energiemesstechnik, PTB-Braunschweig
Moreau, Omer; Laboratoire National de Métrologie et d’Essais, Paris, FRANCE
Muñoz, Fabio; Delft University of Technology (TU Delft), Delft, THE NETHERLANDS
Saadeddine, Hanane; Laboratoire National de Métrologie et d’Essais, Paris, FRANCE
Quelle/Jahr (2026)
Verlag Piscataway, NJ: IEEE
Konferenzangaben Conference on Precision Electromagnetic Measurements (CPEM), Madrid, 06-11, September, 2026, Spain
Freie Schlagworte Digitizers ; Nanosecond pulses ; Step response ; High voltage ; High current
Zusammenfassung Accurate measurement of high voltage nanosecond pulses requires digitizers with well characterised dynamic performance. Measurement accuracy is strongly influenced not only by the dynamic response of the voltage sensors but also by the acquisition system itself. This paper presents a square wave generator based methodology for the dynamic characterisation of digitizers used in high voltage measurement systems. Key parameters, including rise time, settling time and amplitude accuracy are evaluated. Convolution techniques derived from the measured step response are applied to quantify and compensate waveform distortions introduced by the digitizer. The proposed approach provides a practical framework for enhancing traceability and ensuring reliable measurements of high voltage nanosecond transients.
Themenbereich der Metrologie Elektrizität und Magnetismus
Forschungsprojekt 24GRD05 ELITE - Metrological infrastructure for traceable electrical insulation testing for a reliable electricity grid
Förderinformationen (1) Förderername: European Commission (EC)
Förderer ID: 0000 0001 2242 8989
Förderer ID Typ: ISNI
Förderprogramm: Metrology Partnership, Green Deal
Titel der Förderung: 24GRD05 ELITE: Metrological infrastructure for traceable electrical insulation testing for a reliable electricity grid
Förderungsnummer: 24GRD05 ELITE

Zitierung

Agazar, M., Meisner, J., Moreau, O., Muñoz, F., & Saadeddine, H. (2026). Metrological traceability of digitizers for the measurement of high voltage nanosecond pulses. Conference on Precision Electromagnetic Measurements (CPEM), Madrid, 06-11, September, 2026, Spain.

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