| Zugriffsnummer | 55587 |
| Dokumenttyp | Zeitschriftenartikel |
| Peer Review | mit Peer Review |
| Sprache | Englisch |
| Titel | A do-it-yourself atomic force microscope using printed circuit board framework |
| Autor(in); Institution |
Bütefisch, Sebastian; 5.2, Dimensionelle Nanometrologie, PTB-Braunschweig
Danzebrink, Hans-Ulrich; 5.2, Dimensionelle Nanometrologie, PTB-Braunschweig
Huang, Kuang-Yuh; Department of Mechanical Engineering, National Taiwan University, Taipei, TAIWAN
Hwu, Edwin En-Te; Department of Health Technology, Technical University of Denmark, Lyngby, DENMARK
|
| Quelle/Jahr | Measurement Science and Technology: 36 (2025), 9, 1 - 7 |
| Artikelnummer | 097003 |
| ISSN | 1361-6501 (online) ; 0957-0233 (print) |
| DOI | |
| Verlag | Bristol: IOP Publ. |
| Freie Schlagworte | atomic force microscopy ; AFM ; nanoscale imaging ; optical data storage technology ; optical pickup units ; subnanometer resolution ; high-speed AFM |
| Zusammenfassung | The atomic force microscope (AFM) is a high-resolution instrument that has applications in nanoscience. However, the cost and complexity of an AFM are barriers for people to access this tool. In this study, we design and evaluate a do-it-yourself (DIY) AFM by using low-cost consumer electronic components. In the DIY AFM, a precise scanner and cantilever detection system were realized using disk buzzers and an optical pickup unit, respectively. The mechanical framework with an optional anti-vibration suspension was constructed using printed circuit boards (PCBs), which allows the users to assemble the AFM easily. Experiments verified that the DIY AFM can achieve subnanometer resolution in the vertical direction. The PCB framework supported high-speed scanning at a scan rate of 40 lines s−1 and had a low thermal drift of approximately 6.2 nm min−1. |
| Themenbereich der Metrologie | Nanometrologie |
Zitierung
Wang, J.-H., Liao, H.-S., Bütefisch, S., Danzebrink, H.-U., Hwang, I.-S., Huang, K.-Y., & Hwu, E. E.-T. (2025). A do-it-yourself atomic force microscope using printed circuit board framework. Measurement Science and Technology, 36(9), 1–7. https://doi.org/10.1088/1361-6501/ae08d1