| Zugriffsnummer | 55152 |
| Dokumenttyp | Konferenzartikel |
| Peer Review | mit Peer Review |
| Sprache | Englisch |
| Titel | The NewAthena x-ray optics [invited paper] |
| Autor(in); Institution |
Bavdaz, Marcos; European Space Agency, THE NETHERLANDS
Martin-Lagarde, Marine; European Space Agency, THE NETHERLANDS
Fransen, Sebastiaan; European Space Agency, THE NETHERLANDS
Smid, Pieter; European Space Agency, THE NETHERLANDS
Boualam, Habib; European Space Agency, THE NETHERLANDS
Safa, Frédéric; European Space Agency, THE NETHERLANDS
Girou, David; cosine measurement systems, THE NETHERLANDS
Jenkins, Yvette; cosine measurement systems, THE NETHERLANDS
Vacanti, Giuseppe; cosine measurement systems, THE NETHERLANDS
Landgraf, Boris; cosine measurement systems, THE NETHERLANDS
Collon, Maximilien J.; cosine measurement systems, THE NETHERLANDS
Olde Riekerink, Mark; Micronit B.V., THE NETHERLANDS
Haneveld, Jeroen; Micronit B.V., THE NETHERLANDS
Start, Ronald; Micronit B.V., THE NETHERLANDS
Schurink, Bart; Micronit B.V., THE NETHERLANDS
Della Monica Ferreira, Desiree; DTU Space, DENMARK
Massahi, Sonny; DTU Space, DENMARK
Svendsen, Sara; DTU Space, DENMARK
Paredes-Sanz, Diego; DTU Space, DENMARK
Fechner, Robert; 7.2, Röntgenmesstechnik mit Synchrotronstrahlung, PTB-Berlin
Burwitz, Vadim; MPI für extraterrestrische Physik, Garching, GERMANY
Pareschi, Giovanni; INAF Osservatorio Astronomico di Brera, Merate (LC), ITALY
Salmaso, Bianca; INAF Osservatorio Astronomico di Brera, Merate (LC), ITALY
Moretti, Alberto; INAF Osservatorio Astronomico di Brera, Merate (LC), ITALY
Spiga, Daniele; INAF Osservatorio Astronomico di Brera, Merate (LC), ITALY
Basso, Stefano; INAF Osservatorio Astronomico di Brera, Merate (LC), ITALY
Valsecchi, Giuseppe; Media Lario S.r.l., Località Pascolo, Bosisio Parini (LC), ITALY
Vernani, Dervis; Media Lario S.r.l., Località Pascolo, Bosisio Parini (LC), ITALY
Bellett, Gemma; Teledyne imaging Ltd., Chelmsford, Essex, ENGLAND
Riede, Mirko; Fraunhofer Institute for Material and Beam Technology, Dresden, GERMANY
Korhonen, Tapio; Opteon Oy, Piikkiö, FINLAND
Pasanen, Mikko; Opteon Oy, Piikkiö, FINLAND
Sanchez, Alejandro; ALBA Synchrotron, Barcelona, SPAIN
Heinis, Dominique; ALBA Synchrotron, Barcelona, SPAIN
Torras, Joan; ALBA Synchrotron, Barcelona, SPAIN
Bressan, Riccardo; EIE Space Technologies Srl, Mestre-Venezia, ITALY
Niewrzella, Norman; ZEISS Semiconductor Manufacturing Optics GmbH, Oberkochen, GERMANY
Willingale, Richard; University of Leicester, Leicester, UK
Christensen, Finn; CHEXS ApS, Lyngby, DENMARK
|
| Quelle/Jahr | Optics for EUV, X-Ray, and Gamma-Ray Astronomy XII:(2025), 1362602-1 - 1362602-14 |
| Artikelnummer | 1362602 |
| Schriftenreihe | Proceedings of SPIE: 13626 |
| Herausgeber(in) |
Gaskin, Jessica A.
Spiga, Daniele
|
| ISSN | 0277-786X |
| DOI | |
| Verlag | Bellingham, Wash.: SPIE |
| Konferenzangaben | Optics for EUV, X-Ray, and Gamma-Ray Astronomy XII, San Diego, 3-7, August, 2025, Californien, USA |
| Freie Schlagworte | X-ray optics ; X-ray astronomy ; NewAthena ; Silicon Pore Optics ; X-ray telescopes ; X-ray testing ; Technology spin-in ; European Space Agency |
| Zusammenfassung | The NewAthena (New Advanced Telescope for High ENergy Astrophysics) mission is the next generation X-ray observatory of ESA and is currently being studied and technologically prepared for adoption early 2027. NewAthena builds on a novel X-ray optics technology specifically developed for this mission. With a diameter of almost 2.5 meters, and consisting of hundreds of co-aligned mirror modules, made of paper-thin mirrors, NewAthena achieves an angular resolution significantly better than that of the XMM-Newton telescope. The Silicon Pore Optics (SPO) delivers to the challenge the NewAthena X-ray optics poses, benefiting from technology spin-in from the semiconductor industry. The optics is highly modular and is robust by design; its production is largely automatised and cost effective. This paper provides an overview of the ongoing activities readying the SPO technology for the NewAthena mission, from the production of mirror elements, over the assembly into modules, to the accurate integration into the Mirror Assembly Structure of the spacecraft. The performance verification and the preparation of the required production and characterisation facilities is also discussed. |
| Themenbereich der Metrologie | Photometrie und Radiometrie |
Zitierung
Bavdaz, M., Martin-Lagarde, M., Fransen, S., Smid, P., Boualam, H., Safa, F., Girou, D., Jenkins, Y., Vacanti, G., Landgraf, B., Collon, M. J., Olde Riekerink, M., Haneveld, J., Start, R., Schurink, B., Della Monica Ferreira, D., Massahi, S., Svendsen, S., Paredes-Sanz, D., Krumrey, M., Skroblin, D., Fechner, R., Burwitz, V., Pareschi, G., Salmaso, B., Moretti, A., Spiga, D., Basso, S., Valsecchi, G., Vernani, D., Bellett, G., Riede, M., Korhonen, T., Pasanen, M., Sanchez, A., Heinis, D., Torras, J., Bressan, R., Niewrzella, N., Willingale, R., & Christensen, F. (2025). The NewAthena x-ray optics [invited paper]. Optics for EUV, X-Ray, and Gamma-Ray Astronomy XII, San Diego, 3-7, August, 2025, Californien, USA. https://doi.org/10.1117/12.3063271