2025 IMEKO TC-6 International Conference on Metrology and Digital Transformation, Benevento, 3-5, September, 2025, Italy
Zusammenfassung
Universal, unambiguous, safe, and easy to use metadata models are a critical prerequisite for the efficient digitalisation of services and tools in metrology. The D-SI is providing users in metrology and their stakeholders with a simple, yet powerful framework of metadata models for an efficient implementation of data based on the International System of Units. Recent extensions of the D-SI address needs of advanced application such as digital certificates of calibration and findings in respect to the ongoing digitalization under the International Committee of Weights and Measures. Updates are presented comprising improvements of semantics, kinds of quantities, statistical distributions of measurement uncertainties and representations of dependencies of uncertainties.
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Zitierung
Hutzschenreuter, D., Bernien, M., Gellersen, F., Jordan, M., & Seeger, B. (2025). Advanced metrological knowledge representation in the D-SI metadata model. 2025 IMEKO TC-6 International Conference on Metrology and Digital Transformation, Benevento, 3-5, September, 2025, Italy.
