| Zugriffsnummer | 54504 |
| Dokumenttyp | Konferenzartikel |
| Sprache | Englisch |
| Titel | Novel hybrid AI-PID controller |
| Autor(in); Institution |
Degenhardt, Johannes; 5.2, Dimensionelle Nanometrologie, PTB-Braunschweig
Jiao, Zhiang; 5.2, Dimensionelle Nanometrologie, PTB-Braunschweig
Kuhlmann, Christian; 5.2, Dimensionelle Nanometrologie, PTB-Braunschweig
Tutsch, Rainer; Institute of Production Measurement Technology, Technical University of Braunschweig, Braunschweig, GERMANY
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| Quelle/Jahr | Proceedings of the 25th international conference of the european society for precision engineering and nanotechnology, 9th – 13th June 2025, Zaragoza, ES:(2025), 558 - 559 |
| ISBN | 978-1-9989991-6-3 (PDF) |
| Konferenzangaben | euspen 25th International Conference & Exhibition, Zaragoza, 09-13, Juni. 2025, Spain |
| Freie Schlagworte | artificial intelligence (AI) ; servo control ; proportional integral differential (PID) control ; atomic force microscopy ; reliability ; hybrid control |
| Zusammenfassung | In this study, we aim to explore the potential of artificial intelligence (AI) for servo control applications. The prevalent control scheme for such applications is the proportional integral differential (PID) controller. Although PID control is well-established and provides reliable operation, it does not achieve optimal performance, particularly under challenging conditions requiring rapid response. As a solution we realised an AI-based controller using Deep-Q reinforcement learning for a simulated Atomic Force Microscopy (AFM) application, where a servo control is needed to keep the tip-sample interaction constant. Our results showed that the AI-based control may exhibit four times better RMS control deviations than a PID rival. However, further investigations revealed a problem of the AI-based technique: lack of consistency and reliability. The AI may occasionally lose control, although being extensively trained. To solve this problem we propose the application of two hybrid AI-PID controllers and compare them on a real AFM system. Although this study is performed using an AFM as an experimental platform, we believe that the novel concept is of great value for many applications in the field of precision engineering as well. |
| Themenbereich der Metrologie | Nanometrologie |