| Zugriffsnummer | 54484 |
| Dokumenttyp | Zeitschriftenartikel |
| Peer Review | mit Peer Review |
| Sprache | Englisch |
| Titel | An improved protocol for LA-MC-ICP-MS isotope ratio measurements of natural silicon at 213 nm: Comparison of mass bias correction factor dependence (solution vs solid single crystal) and solid sample homogeneity. |
| Autor(in); Institution |
Tongxiang, Ren; Division of Chemical Metrology and Analytical Science, National Institute of Metrology, Beijing, CHINA
Gao, Tianheng; Division of Chemical Metrology and Analytical Science, National Institute of Metrology, Beijing, CHINA
|
| Quelle/Jahr | Journal of Analytical Atomic Spectrometry: 40 (2025), 5, 1323 - 1334 |
| ISSN | 0267-9477 (print) |
| ISBN | 1364-5544 (online) |
| DOI | |
| Verlag | Cambridge: Royal Society of Chemistry (RSC) |
| Zusammenfassung | Nanosecond scanning laser ablation MC-ICP-MS (213 nm) was applied to the measurement of the intensity ratios of ultrapure single crystalline silicon (WASO04), which is used in the XRCD-method and general silicon isotope ratio measurements as a well characterized reference material. Parallel measurements in the same sequence with WASO04 samples (w(Si) = 4 μg g−1) dissolved in TMAH (w(TMAH) = 0.0006 g g−1) were conducted for the comparison of matrix and experimental related impact parameters of the derived calibration factors (K) for the correction of intensity ratios. Uncertainties associated with K factors determined via solid laser ablation multicollector-inductively coupled plasma mass spectrometry (LA-MC-ICP-MS) were in the range of urel(K(29Si/28Si)) = 0.58%, urel(K(30Si/28Si)) = 0.60%, and urel(K(30Si/29Si)) = 0.47%, and exhibit a scattering contribution of up to 50%, whereas K factors derived by Si samples in solution under the same conditions show a more stable course. Main influences on isotope fractionation were derived from the applied laser parameters. Matrix influences due to the kind of sample (solid or dissolved) are negligible. A “quasi-homogeneity” investigation of the local distributions of amount-of substance fractions x(iSi) in the solid sample shows a uniform distribution within the limits of uncertainties. A measurement protocol of isotope ratios of natural silicon was developed using scanning LA-MC-ICP-MS, applying 1013 Ω resistors for Faraday detector readings of highest sensitivity, τ-correction, measurements of interference free (high resolution) Si signals, and strong depletion of the NO+ interference near the 30Si+ signal. |
| Kostenfreier Zugang | Open Access Hybrid |
| Rechteinformation | CC BY 3.0 ; Creative Commons Attribution 3.0 License |
| Themenbereich der Metrologie | Metrologie in der Chemie und Stoffeigenschaften |
Zitierung
Tongxiang, R., Rienitz, O., Gao, T., & Pramann, A. (2025). An improved protocol for LA-MC-ICP-MS isotope ratio measurements of natural silicon at 213 nm: Comparison of mass bias correction factor dependence (solution vs solid single crystal) and solid sample homogeneity. Journal of Analytical Atomic Spectrometry, 40(5), 1323–1334. https://doi.org/10.1039/D5JA00015G