Zugriffsnummer 54299
Dokumenttyp Bericht Freier Zugang
Sprache Englisch
Titel Roughness Metrology: Conversion of profiles from measurements with reference plane profilometers into skidded probe profiles
Autor(in); Institution
Hüser, Dorothee; 5.1, Oberflächenmesstechnik, PTB-Braunschweig
Volk, Raimund; JENOPTIK Industrial Metrology Germany GmbH, Villingen-Schwenningen, GERMANY
Schwarzer, Florian; JENOPTIK Industrial Metrology Germany GmbH, Villingen-Schwenningen, GERMANY
Feifel, Stefan; JENOPTIK Industrial Metrology Germany GmbH, Villingen-Schwenningen, GERMANY
Quelle/Jahr (2025), 25 S.
DOI
Berichtsnummer DKD-E 4-2
Verlag Braunschweig: Physikalisch-Technische Bundesanstalt (PTB)
Freie Schlagworte DKD expert report ; profilometer ; roughness ; stylus instrument ; skidded probe ; stylus tip ; double-skid probe ; EN 10049
Zusammenfassung This expert report presents a procedure for the calibration of roughness standards used to represent the surface quality of sheet metal, which makes it possible to dispense with the use of double-skid probes during calibration. When using this procedure, profiles acquired with reference plane profilers are converted into skid probe profiles. This is relevant for the maximum height parameters, 𝑅z, 𝑅zmax and 𝑅zx. For thin sheets with typical 𝑅z values in the range of 5 μm to 5,5 μm, the results of skid and reference plane profilers differ by approximately 0,6 μm. The uncertainty of the skidless to skidded transformation procedure is approximately 0,1 μm. There is no significant change in the values when determining the arithmetic mean height 𝑅a and the peak value 𝑅Pc or 𝑅pc, so there is no need to convert those values. The skidless to skidded transformation method helps to reduce time needed for modification and adjustment of the measuring set-up, and it eliminates uncertainty components due to form and position tolerances of the double-skid probes. Reduction of the smallest accredited measurement uncertainties is therefore recommended.
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Rechteinformation CC BY-NC-ND 3.0 ; Creative Commons Attribution NonCommercial NoDerivatives 3.0 License

Zitierung

Hüser, D., Volk, R., Schwarzer, F., & Feifel, S. (2025). Roughness Metrology: Conversion of profiles from measurements with reference plane profilometers into skidded probe profiles (Report No. DKD-E 4-2). Braunschweig: Physikalisch-Technische Bundesanstalt (PTB). https://doi.org/10.7795/550.20250207

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