| Zugriffsnummer | 53674 |
| Dokumenttyp | Zeitschriftenartikel |
| Peer Review | mit Peer Review |
| Sprache | Englisch |
| Titel | Quadratic Zeeman and electric quadrupole shifts in highly charged ions |
| Autor(in); Institution |
Gilles, Jan; FPM, Fundamentale Physik für Metrologie, PTB-Braunschweig; Institut für Mathematische Physik, Technische Universität Braunschweig, Braunschweig, GERMANY; Technische Universität München, München, GERMANY
Fritzsche, Stephan; Helmholtz Institute Jena, Jena, GERMANY; Atomic Physics Division, GSI Helmholtzzentrum für Schwerionenforschung, Darmstadt, GERMANY; Theoretisch-Physikalisches Institut, Friedrich-Schiller-Universitat Jena, Jena, GERMANY
|
| Quelle/Jahr | Physical Review A: 110 (2024), 052812-1 - 052812-12 |
| Artikelnummer | 052812 |
| ISSN | 1050-2947 (print) ; 1094-1622 (online) |
| DOI | |
| Verlag | College Park, MD: American Physical Society (APS) |
| Freie Schlagworte | Atomic & molecular processes in external fields ; Atomic & molecular structure ; Stark effect ; Zeeman effect ; Trapped ions ; Hartree-Fock methods ; Perturbative methods |
| Zusammenfassung | Recent advances in high-precision spectroscopy of highly charged ions necessitate an understanding of energy shifts of ionic levels caused by external electric and magnetic fields. Beyond the well-known Stark and linear Zeeman shifts, trapped ions may also exhibit quadratic Zeeman and electric quadrupole shifts. In this contribution, we present a systematic approach for the theoretical analysis of these shifts for arbitrary many-electron ions. Based on the derived expressions and making use of the multiconfigurational Dirac-Fock approach, we performed calculations of quadratic Zeeman shift coefficients and quadrupole moments for various ionic states in Ca14+, Ni12+, and Xe𝑞+ ions. These ions attract particular interest for ongoing and future experiments in optical clocks and tests of fundamental physics. |
| Themenbereich der Metrologie | Zeit und Frequenz |
| Innovationscluster | Quantentechnologie |
| Geschäftsfelder | Grundlagen der Metrologie |