Zugriffsnummer 51206
Dokumenttyp Zeitschriftenartikel Open Access Gold
Peer Review mit Peer Review
Sprache Englisch
Titel Sub-micron inline thickness measurement of cold-rolled metal strips by multi-wavelength interferometry and laser triangulation
Autor(in); Institution
Krauhausen, Michael; VOLAS GmbH, Aachen, GERMANY
Priem, Roland; VOLAS GmbH, Aachen, GERMANY
Prellinger, Günther; 5.4, Interferometrie an Maßverkörperungen, PTB-Braunschweig
Pollinger, Florian; 5.4, Interferometrie an Maßverkörperungen, PTB-Braunschweig
Quelle/Jahr Optics Express: 31 (2023), 26, 43804 - 43820
Availability [online only]
ISSN 1094-4087 (online)
DOI
Verlag Washington, DC: Optica
Freie Schlagworte thickness gauge ; distance sensor ; 2f/3f interferometry ; sinusoidal modulation interferometry ; multi-wavelength interferometry ; laser triangulation ; measurement uncertainty
Zusammenfassung Thin metal foils of thicknesses below 100 µm are finding increasing use in high-tech applications. For such foils it is essential that production be controlled inline with sub-micron accuracy in highly challenging environments. An optical thickness gauge combining laser triangulation with multi-wavelength interferometry has now been developed for this purpose. Modulation-based 2f-3f-interferometry was used to realize a compact and robust sensor. A thorough measurement uncertainty analysis of the complete thickness measurement process yielded an expanded measurement uncertainty of U =sqrt((0.3 μm)2+4 π Ra2), which is dependent on the roughness average Ra The influence of oil remnants on measurement results is significantly weaker in the interference measurement than in geometric optical systems. Verification measurements against tactile reference measurements support the derived measurement uncertainty, and initial measurements in actual rolling mill environments have proven the real-world capability of this measurement technique over relevant process time scales at metal strip speeds of 200 m/min.
Kostenfreier Zugang Open Access Gold
Rechteinformation CC BY 4.0 ; Creative Commons Attribution 4.0 License
Themenbereich der Metrologie Länge, dimensionelle Metrologie
Förderinformationen (1) Förderername: Bundesministerium für Wirtschaft und Klimaschutz (BMWK)
Förderer ID: 0000 0001 0945 2036
Förderer ID Typ: ISNI
Förderprogramm: TransMeT 2016-II-07
Förderungsnummer: ZIM EP190169

Zitierung

Krauhausen, M., Priem, R., Prellinger, G., & Pollinger, F. (2023). Sub-micron inline thickness measurement of cold-rolled metal strips by multi-wavelength interferometry and laser triangulation. Optics Express, 31(26), 43804–43820. https://doi.org/10.1364/OE.504102

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