Zugriffsnummer 51068
Dokumenttyp Konferenzartikel
Peer Review unbekannt
Sprache Englisch
Titel Validation of data evaluation algorithm for the calibration of 3D standards using an AFM simulator
Autor(in); Institution
Xu, Min; 5.1, Oberflächenmesstechnik, PTB-Braunschweig
Dai, Gaoliang; 5.2, Dimensionelle Nanometrologie, PTB-Braunschweig
Quelle/Jahr NanoScale 2023: Dimensional and related measurements in the micro- and nanometre range:(2023), 69 - 71
Artikelnummer E-3
Konferenzangaben NanoScale 2023, Helsinki, 10-12, October, 2023, Finland
Freie Schlagworte 3D calibration ; Scanning probe microscopy ; Simulation ; Monte Carlo
Zusammenfassung Compared to the classical instrument calibration procedure requiring separate lateral and vertical calibration standards, the “nanomarker”-based 3D standard with the shape of cascade step-slope pyramids can calibrate three scale factors of the measurement instrument as well as three coupling factors using only one piece of sample and in one measurement, thus offering great application convenience. To verify the calibration performance of 3D standards, a pilot study aimed to investigate the calibration performance of 3D standards is currently being carried out among several NMIs including PTB, NMIJ, and NPL. In this pilot study, it is agreed that the data evaluation algorithm, which was delicately developed by Point electronic GmbH and offered as an essential part of the solution package, is applied for the data evaluation. However, from the quality management point of view, it is of high importance to validate the error attributable to the data evaluation algorithm beyond the comparison, as such error cannot be validated by the comparison itself A software validation method for the calibration of 3D standards has been developed. The method applies two different kinds of reference data: (i) simulated AFM images, which are generated from the given feature geometries (i.e., ground true values) of 3D standards using a virtual AFM developed at the PTB [1]. After the simulated AFM images are evaluated by the to-be-validated software/algorithm, its output (i.e., the x-, y- and z- coordinates of nanomarkers) can be compared to the ground true values for evaluating its performance. Possible measurement influences such as noise, drift, and tip contribution can be introduced in the simulation process so that the validation process fits better to real measurement conditions. (ii) a real AFM image of a 3D standard from e.g., a metrological AFM. In the validation, we simulate the deformation of the real AFM image for different scenarios if the AFM has certain scaling or coupling factors (ground trues). Then, by inputting the deformed AFM image as measurement data and the real AFM image as the reference data, the output of the software (i.e., the calculated scaling and coupling factors) can be compared to the ground true values for validation. As an example, simulated images of a 3D standard (Fig. 1) are generated and transformed by a firstorder linear calibration matrix. The three linear scale factors and three coupling factors in the calibration matrix are random values acquired by the Monte Carlo method. The transformed images are then evaluated by the to-be-validated algorithm. Comparing the evaluation results with the input calibration matrix, the accuracy of the evaluation algorithm can be proved. This investigation also indicates the influence of 3D standard type and imaging parameters, such as the scan range and pixel number. It makes the calibration results from images with different parameters more comparable. In the validation example, the linear scale factors Cx, Cy and Cz in the input first-order linear calibration matrix vary between [0.99, 1.01], the coupling factor Cxy between [-0.01, 0.01], and Cxz and Cyz between [-0.05, 0.05]. All the above factors vary with a uniform distribution. The mean values ± standard deviation of the difference between the input and the evaluated results by the tobe- validated algorithm are drawn in Fig.2. The difference ΔCx, ΔCy and ΔCxy are smaller than 10-4, and ΔCz, ΔCxz and ΔCyz are smaller than 3 x 10-3. The evaluation error of Cz, Cxz and Cyz in the simulation measurement of artifact MMC80 with 512 x 512 pixels is noticeably larger than the other three simulation measurements

Zitierung

Xu, M. & Dai, G. (2023). Validation of data evaluation algorithm for the calibration of 3D standards using an AFM simulator. NanoScale 2023, Helsinki, 10-12, October, 2023, Finland.

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