| Zugriffsnummer | 50951 |
| Dokumenttyp | Konferenzartikel |
| Peer Review | mit Peer Review |
| Sprache | Englisch |
| Titel | High-resolution and light-weight silicon pore x-ray optics |
| Autor(in); Institution |
Landgraf, Boris; cosine measurement systems, THE NETHERLANDS
Collon, Maximilien J.; cosine measurement systems, THE NETHERLANDS
Abalo, Luis; cosine measurement systems, THE NETHERLANDS
Barrière, Nicolas M.; cosine measurement systems, THE NETHERLANDS
Bayerle, Alex; cosine measurement systems, THE NETHERLANDS
de Borst, Donny; cosine measurement systems, THE NETHERLANDS
Castiglione, Luigi; cosine measurement systems, THE NETHERLANDS
Crama, Loes; cosine measurement systems, THE NETHERLANDS
Chatbi, Abdelhakim; cosine measurement systems, THE NETHERLANDS
Eenkhoorn, Noë; cosine measurement systems, THE NETHERLANDS
Girou, David A.; cosine measurement systems, THE NETHERLANDS
Günther, Ramses; cosine measurement systems, THE NETHERLANDS
Hauser, Enrico; cosine measurement systems, THE NETHERLANDS
van der Hoeven, Roy; cosine measurement systems, THE NETHERLANDS
den Hollander, Jasper; cosine measurement systems, THE NETHERLANDS
Jenkins, Yvette; cosine measurement systems, THE NETHERLANDS
Lassise, Adam; cosine measurement systems, THE NETHERLANDS
Keek, Laurens; cosine measurement systems, THE NETHERLANDS
Körnig, Christian; cosine measurement systems, THE NETHERLANDS
Obwaller, Sebastian; cosine measurement systems, THE NETHERLANDS
Okma, Ben; cosine measurement systems, THE NETHERLANDS
da Silva Ribeiro, Paulo; cosine measurement systems, THE NETHERLANDS
Rizos, Chris; cosine measurement systems, THE NETHERLANDS
Thete, Aniket; cosine measurement systems, THE NETHERLANDS
Vacanti, Giuseppe; cosine measurement systems, THE NETHERLANDS
Verhoeckx, Sjoerd; cosine measurement systems, THE NETHERLANDS
Vervest, Mark; cosine measurement systems, THE NETHERLANDS
Visser, Roel; cosine measurement systems, THE NETHERLANDS
Voruz, Luc; cosine measurement systems, THE NETHERLANDS
Bavdaz, Marcos; European Space Agency, THE NETHERLANDS
Ferreira, Ivo; European Space Agency, THE NETHERLANDS
Wille, Eric; European Space Agency, THE NETHERLANDS
Haneveld, Jeroen; Micronit B.V., THE NETHERLANDS
Koelewijn, Arenda; Micronit B.V., THE NETHERLANDS
Lankwarden, Jan-Joost; Micronit B.V., THE NETHERLANDS
Riekerink, Mark Olde; Micronit B.V., THE NETHERLANDS
Schurink, Bart; Micronit B.V., THE NETHERLANDS
Start, Ronald; Micronit B.V., THE NETHERLANDS
Wijnperlé, Maurice; Micronit B.V., THE NETHERLANDS
van Baren, Coen; SRON Netherlands Institute for Space Research, THE NETHERLANDS
Cibik, Levent; 7.2, Röntgenmesstechnik mit Synchrotronstrahlung, PTB-Berlin
Burwitz, Vadim; Max-Planck-Institut für extraterrestrische Physik, GERMANY
Christensen, Finn Erland; CHEXS ApS, THE NETHERLANDS
Ferreira, Desiree Della Monica; DTU Space, DENMARK
Massahi, Sonny; DTU Space, DENMARK
Svendsen, Sara; DTU Space, DENMARK
Dunnell, Ethan; Teledyne e2v UK Ltd., UK
Lupton, Paul; Teledyne e2v UK Ltd., UK
Mundon, William; Teledyne e2v UK Ltd., UK
Rees, Andrew; Teledyne e2v UK Ltd., UK
Paredes Sanz, Diego; DTU Space, DENMARK
Bosman, Mathijs; Micronit B.V., THE NETHERLANDS
|
| Quelle/Jahr | Optics for EUV, X-ray, and Gamma-ray astronomy XI:(2023), 1267903-1 - 1267903-8 |
| Artikelnummer | 1267903 |
| Schriftenreihe | Proceedings of SPIE: 12679 |
| Herausgeber(in) |
O'Dell, Stephen L.
Gaskin, Jessica A.
Pareschi, Giovanni
Spiega, Daniele
|
| ISSN | 0277-786X |
| DOI | |
| Verlag | Bellingham, Wash.: SPIE |
| Konferenzangaben | SPIE Optics + Photonics, San Diego, CA, 20-24, August, 2023, USA |
| Freie Schlagworte | Mirrors ; Silicon ; Semiconducting wafers ; X-ray optics ; Wafer-level optics Ion beam finishing ; Synchrotron radiation ; X-rays ; Laser cutting ; Mirror surfaces |
| Zusammenfassung | Silicon Pore Optics (SPO) have been invented and developed to enable X-ray optics for space applications that require a combination of high angular resolution while being light-weight to allow achieving a large mirror surface area. In 2005, the SPO technology development was initiated by the European Space Agency (ESA) for a flagship X-ray telescope mission and is currently being planned as a baseline for the NewATHENA mission scheduled for launch in the 2030s. Its ~2.5-m diameter mirror will be segmented and comprises more than 600 individual Silicon Pore Optics (SPO) grazing-angle imagers, called mirror modules. Arranged in concentric annuli and following a Wolter-Schwartzschild design, the mirror modules are made of several tens of primary-secondary mirror pairs, each mirror made of silicon, coated to increase the collective area of the system, and shaped to bring the incoming photons to a common focus 12 m away. The mission aims to deliver an angular resolution of 5” (Half-energy width) and effective area of about 1.4 m2 at an energy of 1 keV. We present in this paper the status of the optics production, and illustrate not only recent X-ray results but also the progress made on the environmental testing, manufacturing and assembly aspects of SPO based optics. |
| Themenbereich der Metrologie | Photometrie und Radiometrie |
Zitierung
Landgraf, B., Collon, M. J., Abalo, L., Barrière, N. M., Bayerle, A., de Borst, D., Castiglione, L., Crama, L., Chatbi, A., Eenkhoorn, N., Girou, D. A., Günther, R., Hauser, E., van der Hoeven, R., den Hollander, J., Jenkins, Y., Lassise, A., Keek, L., Körnig, C., Obwaller, S., Okma, B., da Silva Ribeiro, P., Rizos, C., Thete, A., Vacanti, G., Verhoeckx, S., Vervest, M., Visser, R., Voruz, L., Bavdaz, M., Ferreira, I., Wille, E., Haneveld, J., Koelewijn, A., Lankwarden, J.-J., Riekerink, M. O., Schurink, B., Start, R., Wijnperlé, M., van Baren, C., Cibik, L., Krumrey, M., Burwitz, V., Christensen, F. E., Ferreira, D. D. M., Massahi, S., Svendsen, S., Dunnell, E., Lupton, P., Mundon, W., Rees, A., Skroblin, D., Paredes Sanz, D., & Bosman, M. (2023). High-resolution and light-weight silicon pore x-ray optics. SPIE Optics + Photonics, San Diego, CA, 20-24, August, 2023, USA. https://doi.org/10.1117/12.2678106