| Zugriffsnummer | 50250 |
| Dokumenttyp | Zeitschriftenartikel |
| Peer Review | mit Peer Review |
| Sprache | Englisch |
| Titel | Simple extension of the plane-wave final state in photoemission: Bringing understanding to the photon-energy dependence of two-dimensional materials |
| Autor(in); Institution |
Kern, Christian; Institute of Physics, University of Graz, Graz, AUSTRIA
Haags, Anja; Peter Grünberg Institut (PGI-3), Forschungszentrum Jülich, Jülich, GERMANY
Egger, Larissa; Institute of Physics, University of Graz, Graz, AUSTRIA
Yang, Xiaosheng; Peter Grünberg Institut (PGI-3), Forschungszentrum Jülich, Jülich, GERMANY
Wolff, Susanne; Institute of Physics, Chemnitz University of Technology, Chemnitz, GERMANY
Seyller, Thomas; Institute of Physics, Chemnitz University of Technology, Chemnitz, GERMANY
De Giovannini, Umberto; Max Planck Institute for the Structure and Dynamics of Matter, Hamburg, GERMANY
Rubio, Angel; Max Planck Institute for the Structure and Dynamics of Matter, Hamburg, GERMANY
Bocquet, François C.; Peter Grünberg Institut (PGI-3), Forschungszentrum Jülich, Jülich, GERMANY
Soubatch, Serguei; Peter Grünberg Institut (PGI-3), Forschungszentrum Jülich, Jülich, GERMANY
Tautz, F. Stefan; Peter Grünberg Institut (PGI-3), Forschungszentrum Jülich, Jülich, GERMANY
Puschnig, Peter; Institute of Physics, University of Graz, Graz, AUSTRIA
Ramsey, Michael G.; Institute of Physics, University of Graz, Graz, AUSTRIA
Moser, Simon; Physikalisches Institut and Würzburg-Dresden Cluster of Excellence ct.qmat, Universität Würzburg, Würzburg, GERMANY
|
| Quelle/Jahr | Physical Review Research: 5 (2023), 3, 1 - 16 |
| Artikelnummer | 033075 |
| Availability | [online only] |
| ISSN | 2643-1564 (online) |
| DOI | |
| Verlag | College Park, MD: APS |
| Zusammenfassung | Angle-resolved photoemission spectroscopy (ARPES) is a method that measures orbital and band structure contrast through the momentum distribution of photoelectrons. Its simplest interpretation is obtained in the plane-wave approximation, according to which photoelectrons propagate freely to the detector. The photoelectron momentum distribution is then essentially given by the Fourier transform of the real-space orbital. While the plane-wave approximation is remarkably successful in describing the momentum distributions of aromatic compounds, it generally fails to capture kinetic-energy-dependent final-state interference and dichroism effects. Focusing our present study on quasi-freestanding monolayer graphene as the archetypical two-dimensional (2D) material, we observe an exemplary Ekin-dependent modulation of, and a redistribution of spectral weight within, its characteristic horseshoe signature around the ¯K and ¯K′ points: both effects indeed cannot be rationalized by the plane-wave final state. Our data are, however, in remarkable agreement with ab initio time-dependent density functional simulations of a freestanding graphene layer and can be explained by a simple extension of the plane-wave final state, permitting the two dipole-allowed partial waves emitted from the C 2pz orbitals to scatter in the potential of their immediate surroundings. Exploiting the absolute photon flux calibration of the Metrology Light Source, this scattered-wave approximation allows us to extract Ekin-dependent amplitudes and phases of both partial waves directly from photoemission data. The scattered-wave approximation thus represents a powerful yet intuitive refinement of the plane-wave final state in photoemission of 2D materials and beyond. |
| Kostenfreier Zugang | Open Access Gold |
| Rechteinformation | CC BY 4.0 ; Creative Commons Attribution 4.0 License |
| Themenbereich der Metrologie | Photometrie und Radiometrie |
Zitierung
Kern, C., Haags, A., Egger, L., Yang, X., Kirschner, H., Wolff, S., Seyller, T., Gottwald, A., Richter, M., De Giovannini, U., Rubio, A., Bocquet, F. C., Soubatch, S., Tautz, F. S., Puschnig, P., Ramsey, M. G., & Moser, S. (2023). Simple extension of the plane-wave final state in photoemission: Bringing understanding to the photon-energy dependence of two-dimensional materials. Physical Review Research, 5(3), 1–16. https://doi.org/10.1103/PhysRevResearch.5.033075