| Zugriffsnummer | 49889 |
| Dokumenttyp | Zeitschriftenartikel |
| Peer Review | mit Peer Review |
| Sprache | Englisch |
| Titel | Modeling and analytical description of parasitic probe effects in measurements of conductor-backed coplanar waveguides |
| Autor(in); Institution | |
| Quelle/Jahr | Advances in Radio Science: 20 (2023), 119 - 129 |
| Availability | [online only] |
| ISSN | 1684-9973 (online) |
| DOI | |
| Verlag | Göttingen: Copernicus |
| Zusammenfassung | On-wafer measurements are of fundamental importance to the characterization of active and passive devices at millimetre-wave frequencies. They have been commonly known to be ambitious and challenging due to the occurrence of parasitic effects originating from probes, multimode propagation, crosstalk between adjacent structures and radiation. While a lot of investigations have been performed for conventional coplanar waveguides (CPW) measured on ceramic chucks, the parasitic effects occuring in conductor-backed CPWs (CB-CPWs) have not been fully understood yet. Therefore, this paper presents a thorough study for CB-CPWs based on electromagnetic simulations. Additionally, this paper proposes an analytical description accounting for the probe geometries to predict the occurrence of resonance effects due to the propagation of the parallel-plate-line (PPL) mode. For the first time, a new analytical description including the effects of the probe geometries is presented and validated by both measurements and simulations. |
| Kostenfreier Zugang | Open Access Gold |
| Rechteinformation | CC BY 4.0 ; Creative Commons Attribution 4.0 License |
| Themenbereich der Metrologie | Elektrizität und Magnetismus |
| Forschungsprojekt | 14IND02: PlanarCal: Microwave measurements for planar circuits and components ; 20IND03: FutureCom: RF Measurements for future communications applications |
| Förderinformationen (1) |
Förderername: European Commission (EC)
Förderer ID: 0000 0001 2242 8989 Förderer ID Typ: ISNI Förderprogramm: EMPIR 2014 Industry Titel der Förderung: 14IND02: PlanarCal: Microwave measurements for planar circuits and components Förderungsnummer: 14IND02 |
| Förderinformationen (2) |
Förderername: European Commission (EC)
Förderer ID: 0000 0001 2242 8989 Förderer ID Typ: ISNI Förderprogramm: EMPIR 2020 Industry Titel der Förderung: 20IND03: FutureCom: RF Measurements for future communications applications Förderungsnummer: 20IND03 |