| Zugriffsnummer | 49566 |
| Dokumenttyp | Konferenzartikel |
| Peer Review | unbekannt |
| Sprache | Englisch |
| Titel | Uncertainties of on-wafer millimeter-wave and THz S-parameter measurements |
| Autor(in); Institution |
Allal, Djamel; Laboratoire national de métrologie et d’essais (LNE), Paris, FRANCE
Mubarak, Faisal; Van Swinden Laboratorium (VSL), Delft, THE NETHERLANDS
Flisgen, Thomas; Ferdinand-Braun-Institut gGmbH, Berlin, GERMANY
Schmidt, Robin; Keysight Technologies, KU Leuven, BELGIUM
|
| Quelle/Jahr | 2022 Conference on Precision Electromagnetic Measurements (CPEM), Wellington, New Zealand:(2022), 2 S. |
| ISBN | 978-1-6654-7270-8 |
| Verlag | IEEE |
| Konferenzangaben | Conference on Precision Electromagnetic Measurements (CPEM) 2022, Wellington, 12-16, December, 2022, New Zealand |
| Freie Schlagworte | Millimeter-wave ; THz ; on-wafer ; S-parameters ; uncertainties ; traceability |
| Zusammenfassung | This paper describes an uncertainty analysis of onwafer S-parameter measurements in the millimeter-wave and THz regions of the electromagnetic spectrum, with the aim of developing metrological traceability and verification techniques for this field, and more specifically, for application to measurements on planar substrates from 110 GHz to 1.1 THz. An uncertainty framework is developed to fulfil the establishment of traceable measurements using a developed reference calibration substrate and associated verification and calibration methods. All sources of measurement uncertainty were classified into sources, which are suitable, or not suitable, for experimental characterization, in which case, 3D electromagnetic (EM) simulations are investigated as a possible suitable uncertainty evaluation technique. |
| Themenbereich der Metrologie | Elektrizität und Magnetismus |
| Forschungsprojekt | 18SIB09: TEMMT: Traceability for electrical measurements at millimetre-wave and terahertz frequencies for communications and electronics technologies |
| Förderinformationen (1) |
Förderername: European Commission (EC)
Förderer ID: 0000 0001 2242 8989 Förderer ID Typ: ISNI Förderprogramm: EMPIR 2018 SI Broader Scope Titel der Förderung: 18SIB09: TEMMT: Traceability for electrical measurements at millimetre-wave and terahertz frequencies for communications and electronics technologies Förderungsnummer: 18SIB09 |
Zitierung
Allal, D., Phung, G. N., Arz, U., Mubarak, F., Flisgen, T., & Schmidt, R. (2022). Uncertainties of on-wafer millimeter-wave and THz S-parameter measurements. Conference on Precision Electromagnetic Measurements (CPEM) 2022, Wellington, 12-16, December, 2022, New Zealand.