| Zugriffsnummer | 48958 |
| Dokumenttyp | Konferenzartikel |
| Peer Review | unbekannt |
| Sprache | Englisch |
| Titel | Parasitic coupling effects in coplanar short measurements |
| Autor(in); Institution | |
| Quelle/Jahr | 2022 99th ARFTG Microwave Measurement Conference (ARFTG):(2022), 1 - 4 |
| ISBN | 978-1-6654-6894-7 (ONLINE) ; 978-1-6654-6895-4 (PoD) |
| DOI | |
| Verlag | Piscataway, NJ: IEEE |
| Konferenzangaben | 2022 99th ARFTG Microwave Measurement Conference (ARFTG), Denver, 24, June, 2022, USA |
| Freie Schlagworte | calibration ; coplanar waveguides ; on-wafer ; probes ; reflect ; shorts ; standards |
| Zusammenfassung | On-wafer measurements are indispensable for the characterization of electronic devices at millimeter-wave and terahertz frequencies. Recent investigations have demonstrated parasitic effects stemming e.g. from probes, multimode propagation and crosstalk using line standards as devices under test. However, for short-circuited coplanar structures which are often used as reflect standards in on-wafer calibrations, these parasitic effects have not been thoroughly investigated. Therefore, this paper presents a detailed study of parasitic mode effects in conjunction with probe influences occuring in coplanar short measurements. |
| Themenbereich der Metrologie | Elektrizität und Magnetismus |
| Forschungsprojekt | 14IND02: PlanarCal: Microwave measurements for planar circuits and components ; 18SIB09: TEMMT: Traceability for electrical measurements at millimetre-wave and terahertz frequencies for communications and electronics technologies |
| Förderinformationen (1) |
Förderername: European Commission (EC)
Förderer ID: 0000 0001 2242 8989 Förderer ID Typ: ISNI Förderprogramm: EMPIR 2014 Industry Titel der Förderung: 14IND02: PlanarCal: Microwave measurements for planar circuits and components Förderungsnummer: 14IND02 |
| Förderinformationen (2) |
Förderername: European Commission (EC)
Förderer ID: 0000 0001 2242 8989 Förderer ID Typ: ISNI Förderprogramm: EMPIR 2018 SI Broader Scope Titel der Förderung: 18SIB09: TEMMT: Traceability for electrical measurements at millimetre-wave and terahertz frequencies for communications and electronics technologies Förderungsnummer: 18SIB09 |