| Zugriffsnummer | 47652 |
| Dokumenttyp | Konferenzartikel |
| Peer Review | unbekannt |
| Sprache | Englisch |
| Titel | Parasitic probe effects in measurements of conductor-backed coplanar waveguides |
| Autor(in); Institution |
Phung, Gia Ngoc; 2.2, Hochfrequenz und Felder, PTB-Braunschweig
|
| Quelle/Jahr | 2021 Kleinheubach Conference:(2021), 1 - 4 |
| ISBN | 978-3-948571-04-7 (PDF) ; 978-1-6654-0711-3 (PoD) |
| DOI | |
| Verlag | Piscataway, NJ: IEEE |
| Konferenzangaben | Kleinheubacher Tagung 2021, Miltenberg, 28-30, September, 2021, Deutschland |
| Freie Schlagworte | conductor-backed coplanar waveguides ; calibration ; parallel-plate-line or microstrip mode ; probes ; radiation |
| Zusammenfassung | Recently, parasitic effects in on-wafer measurements have been investigated thoroughly and can be classified as stemming from probe effects, multimode propagation, crosstalk between adjacent structures and radiation effects. While a lot of investigations have been performed for conventional coplanar waveguides (CPW) measured on ceramic chucks, the parasitic effects occuring in conductor-backed CPWs (CB-CPWs) have not been fully clarified yet. Therefore, this paper demonstrates how parasitic modes and probe effects deteriorate calibrated S-parameters of CB-CPW structures. |
| Themenbereich der Metrologie | Elektrizität und Magnetismus |
| Forschungsprojekt | 18SIB09: TEMMT: Traceability for electrical measurements at millimetre-wave and terahertz frequencies for communications and electronics technologies ; 14IND02: PlanarCal: Microwave measurements for planar circuits and components |
| Förderinformationen (1) |
Förderername: European Commission (EC)
Förderer ID: 0000 0001 2242 8989 Förderer ID Typ: ISNI Förderprogramm: EMPIR 2014 Industry Titel der Förderung: 14IND02: PlanarCal: Microwave measurements for planar circuits and components Förderungsnummer: 14IND02 |
| Förderinformationen (2) |
Förderername: European Commission (EC)
Förderer ID: 0000 0001 2242 8989 Förderer ID Typ: ISNI Förderprogramm: EMPIR 2018 SI Broader Scope Titel der Förderung: 18SIB09: TEMMT: Traceability for electrical measurements at millimetre-wave and terahertz frequencies for communications and electronics technologies Förderungsnummer: 18SIB09 |