| Zugriffsnummer | 46375 |
| Dokumenttyp | Konferenzartikel |
| Peer Review | unbekannt |
| Sprache | Englisch |
| Titel | Parasitic probe effects in measurements of coplanar waveguides with narrow ground width |
| Autor(in); Institution |
Phung, Gia Ngoc; 2.2, Hochfrequenz und Felder, PTB-Braunschweig
Arz, Uwe; 2.2, Hochfrequenz und Felder, PTB-Braunschweig
|
| Quelle/Jahr | 2020 IEEE 24th Workshop on Signal and Power Integrity (SPI):(2020), 1 - 4 |
| ISBN | 978-1-7281-4204-3 (PDF) ; 978-1-7281-7595-9 (PoD) |
| DOI | |
| Verlag | Piscataway, NJ: IEEE |
| Konferenzangaben | 24th IEEE Workshop on Signal and Power Integrity (SPI), Cologne, 17-20, May, 2020, Germany |
| Freie Schlagworte | calibration ; coplanar waveguides ; multiline Thru-Reflect Line (mTRL) ; probes |
| Zusammenfassung | On-wafer measurements contain a large variety of parasitic effects degrading the accuracy of multiline Thru-Reflect Line (mTRL) calibration. These effects are caused by internal and external disturbances such as probe effects, multimode propagation, crosstalk between adjacent structures and radiation effects. While a lot of investigations have been performed for the most common coplanar waveguides (CPW) with nominal ground width, CPW with too narrow ground width have not been investigated thoroughly. This paper demonstrates how the probe effects deteriorate the mTRL-calibrated S-parameters for CPW structures with narrow ground width. |
| Themenbereich der Metrologie | Elektrizität und Magnetismus |