| Zugriffsnummer | 46153 |
| Dokumenttyp | Zeitschriftenartikel |
| Peer Review | mit Peer Review |
| Sprache | Englisch |
| Titel | Thickness measurement of nm HfO2 films |
| Autor(in); Institution |
Kim, K. J.; KRISS, Daejeon, KOREA
Kim, A.; KRISS, Daejeon, KOREA
Kim, C. S.; KRISS, Daejeon, KOREA
Song, S. W.; KRISS, Daejeon, KOREA
Ruh, H.; KRISS, Daejeon, KOREA
Unger, W. E. S.; BAM, Berlin, GERMANY
Radnik, J.; BAM, Berlin, GERMANY
Mata-Salazar, J.; CENAM, Queretaro, MEXICO
Juarez-Garcia, J. M.; CENAM, Queretaro, MEXICO
Cortazar-Martinez, O.; CINVESTAV, Queretaro, MEXICO
Herrera-Gomez, A.; CINVESTAV, Queretaro, MEXICO
Hansen, P. E.; DFM, Horsholm, DENMARK
Madsen, J. S.; DFM, Horsholm, DENMARK
Senna, C. A.; INMETRO, Rio De Janeiro, BRAZIL
Archanjo, B. S.; INMETRO, Rio De Janeiro, BRAZIL
Damasceno, J. C.; INMETRO, Rio De Janeiro, BRAZIL
Achete, C. A.; INMETRO, Rio De Janeiro, BRAZIL
Wang, H.; NIM, Beijing, CHINA
Wang, M.; NIM, Beijing, CHINA
Windover, D.; NIST, Gaithersburg, USA
Steel, E.; NIST, Gaithersburg, USA
Kurokawa, A.; NMIJ, Tsukuba, JAPAN
Fujimoto, T.; NMIJ, Tsukuba, JAPAN
Azuma, Y.; NMIJ, Tsukuba, JAPAN
Terauchi, S.; NMIJ, Tsukuba, JAPAN
Zhang, L.; NMIJ, Tsukuba, JAPAN
Jordaan, W. A.; NMISA, Pretoria, SOUTH AFRICA
Spencer, S. J.; NPL, Teddington, UK
Shard, A. G.; NPL, Teddington, UK
Koenders, Ludger; 5.1, Oberflächenmesstechnik, PTB-Braunschweig
Krumrey, Michael; 7.2, Röntgenmesstechnik mit Synchrotronstrahlung, PTB-Berlin
Busch, Ingo; 5.1, Oberflächenmesstechnik, PTB-Braunschweig
Jeynes, C.; University of Surrey Ion Beam Centre, Guildford, UK
|
| Quelle/Jahr | Metrologia: 58 (2021), 1A, 108 S. |
| Artikelnummer | 08016 |
| Availability | [online-only] |
| ISSN | 0026-1394 (PRINT) ; 1681-7575 (ONLINE) |
| DOI | |
| Berichtsnummer | CCQM-P 190 |
| Verlag | Bristol: BIPM & IOP Publishing Ltd. |
| Zusammenfassung | A pilot study for the thickness measurement of HfO2 films was performed by the Surface Analysis Working Group (SAWG) of the Consultative Committee for Amount of Substance (CCQM). The aim of this pilot study was to ensure the equivalency in the measurement capability of national metrology institutes for the thickness measurement of HfO2 films. In this pilot study, the thicknesses of six HfO2 films with nominal thickness from 1 nm to 4 nm were measured by X-ray Photoelectron Spectroscopy (XPS), X-ray Reflectometry(XRR), X-ray Fluorescence Analysis (XRF), Transmission Electron Spectroscopy (TEM), Spectroscopic Ellipsometry (SE) and Rutherford Backscattering Spectrometry (RBS). The reference thicknesses were determined by mutual calibration of a zero-offset method (Medium Energy Ion Scattering Spectroscopy (MEIS) of KRISS) and a method traceable to the length unit (the average thicknesses of three XRR data except the thinnest film). These reference thicknesses are traceable to the length unit because they are based on the traceability of XRR. For the thickness measurement by XPS, the effective attenuation length of Hf 4f electrons was determined. In the cases of XRR and TEM, the offset values were determined from a linear fitting between the reference thicknesses and the individual data by XRR and TEM. The amount of substance of HfO2, expressed as thickness of HfO2 films (in both linear and areal density units), was found to be a good subject for a CCQM key comparison. |
| Themenbereich der Metrologie | Photometrie und Radiometrie |
Zitierung
Kim, K. J., Kim, A., Kim, C. S., Song, S. W., Ruh, H., Unger, W. E. S., Radnik, J., Mata-Salazar, J., Juarez-Garcia, J. M., Cortazar-Martinez, O., Herrera-Gomez, A., Hansen, P. E., Madsen, J. S., Senna, C. A., Archanjo, B. S., Damasceno, J. C., Achete, C. A., Wang, H., Wang, M., Windover, D., Steel, E., Kurokawa, A., Fujimoto, T., Azuma, Y., Terauchi, S., Zhang, L., Jordaan, W. A., Spencer, S. J., Shard, A. G., Koenders, L., Krumrey, M., Busch, I., & Jeynes, C. (2021). Thickness measurement of nm HfO2 films. Metrologia, 58(1A), 108 S. https://doi.org/10.1088/0026-1394/58/1a/08016