Zugriffsnummer 45475
Dokumenttyp Zeitschriftenartikel
Peer Review unbekannt
Sprache Englisch
Titel High‐performance waveform‐sampling analysis based on digital multipoint signal averaging
Autor(in); Institution
Parisi, J.; Universität Tübingen, Tübingen, GERMANY
Mühlemeier, B.; Universität Tübingen, Tübingen, GERMANY
Buck, Wolfgang; 9.34, Tieftemperaturanlagen, PTB-Berlin
Quelle/Jahr Review of Scientific Instruments: 57 (1986), 6, 1196 - 1200
ISSN 0034-6748 (PRINT) ; 1089-7623 (ONLINE)
DOI
Verlag Melville, NY: AIP Publishing
Zusammenfassung This paper describes a versatile digital multipoint waveform‐recording system utilizing computer‐aided signal‐averaging procedures. Basically, it consists of a Biomation 8100 transient recorder coupled to a DEC PDP 11/04 computer via an electronic interface device and a CAMAC I/O‐register NE 9066 supported by an appropriate software system. Additional use of an extremely low‐noise wideband preamplifier system together with proper shielding, filtering, and differential measuring techniques minimize the disturbing influence of random and coherent electromagnetic noise. Employing our waveform‐recording system to sensitive time‐resolved flux‐flow measurements in superconductors yields both a voltage resolution approaching 1 nV and a time resolution of 10 ns at a recording bandwidth of 25 MHz. Such a novel scheme of high‐performance waveform‐sampling analysis yields an overall efficiency limited at the characteristic rise‐time sensitivity product of about 10−17 V s, corresponding to a magnetic flux sensitivity far better than a single quantum. An outline of the present uses and future prospects indicates that this method represents an important tool in such advanced fields as low‐temperature solid‐state physics and cryoelectronics and deserves more attention both from a fundamental point of view and for many technological applications.

Zitierung

Parisi, J., Mühlemeier, B., & Buck, W. (1986). High‐performance waveform‐sampling analysis based on digital multipoint signal averaging. Review of Scientific Instruments, 57(6), 1196–1200. https://doi.org/10.1063/1.1138629

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