| Zugriffsnummer | 45374 |
| Dokumenttyp | Zeitschriftenartikel |
| Peer Review | mit Peer Review |
| Sprache | Englisch |
| Titel | Key Comparison CCQM-K143 comparison of copper calibration solutions prepared by NMIs/DIs. |
| Autor(in); Institution |
Molloy, John L.; National Institute of Standards and Technology (NIST), Gaithersburg, Md., USA
Winchester, Michael R.; National Institute of Standards and Technology (NIST), Gaithersburg, Md., USA
Butler, Therese A.; National Institute of Standards and Technology (NIST), Gaithersburg, Md., USA
Possolo, Antonio M.; National Institute of Standards and Technology (NIST), Gaithersburg, Md.,USA
Rienitz, Olaf; 3.1, Allgemeine und Anorganische Chemie, PTB-Braunschweig
Roethke, Anita; 3.1, Allgemeine und Anorganische Chemie, PTB-Braunschweig
Görlitz, Volker; 3.1, Allgemeine und Anorganische Chemie, PTB-Braunschweig
Caciano de Sena, Rodrigo; National Institute of Metrology, Quality and Technology (INMETRO), Xerém, Duque de Caxias-RJ, BRAZIL
Dominguez Almeida, Marcelo; National Institute of Metrology, Quality and Technology (INMETRO), Xerém, Duque de Caxias-RJ, BRAZIL
Yang, Lu; National Research Council Canada (NRC), Ottawa, CANADA
Methven, Brad; National Research Council Canada (NRC), Ottawa, CANADA
Nadeau, Kenny; National Research Council Canada (NRC), Ottawa, CANADA
Romero Arancibia, Patricia; National Copper Corporation of Chile (CODELCO), Calama, CHILE
Bing, Wu; National Institute of Metrology (NIM), Beijing, CHINA
Tao, Zhou; National Institute of Metrology (NIM), Beijing, CHINA
Snell, James; European Commission Joint Research Center (JRC), Geel, BELGIUM
Vogl, Jochen; Bundesanstalt für Materialforschung und -prüfung (BAM), Berlin, GERMANY
Koenig, Maren; Bundesanstalt für Materialforschung und -prüfung (BAM), Berlin, GERMANY
Kotnala, R. K.; National Physical Laboratory, India (NPLI), New Delhi, INDIA
Swarupa Tripathy, S.; National Physical Laboratory, India (NPLI), New Delhi, INDIA
Elishian, Christine; Research Center for Metrology, Indonesian Institute of Sciences (RCM-LIPI), Serpong, Banten, INDONESIA
Ketrin, Rosi; Research Center for Metrology, Indonesian Institute of Sciences (RCM-LIPI), Serpong, Banten, INDONESIA
Suzuki, Toshihiro; National Metrology Institute of Japan (NMIJ), Tsukuba, Ibaraki, Tsukuba, JAPAN
Oduor Okumu, Tom; Kenya Bureau of Standards (KEBS), Nairobi, KENYA
Yim, Yong-Hyeon; Korea Research Institute of Standards and Science (KRISS), Daejeon, KOREA
Woo Heo, Sung; Korea Research Institute of Standards and Science (KRISS), Daejeon, KOREA
Sik Min, Hyung; Korea Research Institute of Standards and Science (KRISS), Daejeon, KOREA
Sub Han, Myung; Korea Research Institute of Standards and Science (KRISS), Daejeon, KOREA
Lim, Youngran; Korea Research Institute of Standards and Science (KRISS), Daejeon, KOREA
Manzano, Judith Velina Lara; Centro Nacional de Metrología (CENAM), Querétaro, MEXICO
Regalado, Francisco Segoviano; Centro Nacional de Metrología (CENAM), Querétaro, MEXICO
Rocio Arvizu Torres, Maria del; Centro Nacional de Metrología (CENAM), Querétaro, MEXICO
Valle Moya, Edith; Centro Nacional de Metrología (CENAM), Querétaro, MEXICO
Buzoianu, Mirella; National Institute of Metrology (INM), Bucharest, ROMANIA
Sobina, Alena; Ural Scientific Research Institute for Metrology (UNIIM), Ekaterinburg, RUSSIA
Zyskin, Veniamin; Ural Scientific Research Institute for Metrology (UNIIM), Ekaterinburg, RUSSIA
Sobina, Egor; Ural Scientific Research Institute for Metrology (UNIIM), Ekaterinburg, RUSSIA
Migal, Pavel; Ural Scientific Research Institute for Metrology (UNIIM), Ekaterinburg, RUSSIA
Linsky, Maré; National Metrology Institute of South Africa (NMISA), Pretoria, SOUTH AFRICA
Can, Süleyman Z; Ulusal Metroloji Enstitüsü, National Metrology Institute of Turkey (TUBITAK UME), TUBITAK , Gebze, TURKEY
Ari, Betul; Ulusal Metroloji Enstitüsü, National Metrology Institute of Turkey (TUBITAK UME), TUBITAK , Gebze, TURKEY
Goenaga Infante, Heidi; LGC Limited (LGC), Teddington, UK
|
| Quelle/Jahr | Metrologia: 58 (2020), 1A, Tech. Suppl., 1 - 38 |
| Artikelnummer | 08006 |
| Availability | [online only] |
| ISSN | 0026-1394 (PRINT) ; 1681-7575 (ONLINE) |
| DOI | |
| Verlag | Bristol: IOP Publishing |
| Themenbereich der Metrologie | Metrologie in der Chemie und Stoffeigenschaften |
Zitierung
Molloy, J. L., Winchester, M. R., Butler, T. A., Possolo, A. M., Rienitz, O., Roethke, A., Görlitz, V., Caciano de Sena, R., Dominguez Almeida, M., Yang, L., Methven, B., Nadeau, K., Romero Arancibia, P., Bing, W., Tao, Z., Snell, J., Vogl, J., Koenig, M., Kotnala, R. K., Swarupa Tripathy, S., Elishian, C., Ketrin, R., Suzuki, T., Oduor Okumu, T., Yim, Y.-H., Woo Heo, S., Sik Min, H., Sub Han, M., Lim, Y., Manzano, J. V. L., Regalado, F. S., Rocio Arvizu Torres, M. D., Valle Moya, E., Buzoianu, M., Sobina, A., Zyskin, V., Sobina, E., Migal, P., Linsky, M., Can, S. Z., Ari, B., & Goenaga Infante, H. (2020). Key Comparison CCQM-K143 comparison of copper calibration solutions prepared by NMIs/DIs. Metrologia, 58(1A, Tech. Suppl.), 1–38. https://doi.org/10.1088/0026-1394/58/1a/08006