| Zugriffsnummer | 45358 |
| Dokumenttyp | Konferenzartikel |
| Peer Review | unbekannt |
| Sprache | Englisch |
| Titel | Characterization of multilayer structures for soft X-ray laser research |
| Autor(in); Institution |
Kühne, Michael; 9.23, Vakuum-UV-Strahlungsmesstechnik, PTB-Berlin
Danzmann, Karsten; PTB-Berlin
Müller, Peter; 9.23, Vakuum-UV-Strahlungsmesstechnik, PTB-Berlin
Wende, Burkhard; 9.2, Hochtemperatur- und Vakuumphysik, PTB-Berlin
Ceglio, Natale M.; Lawrence Livermore National Laboratory, University of California, Livermore, California, USA
Stearns, Daniel G.; Lawrence Livermore National Laboratory, University of California, Livermore, California, USA
Hawryluk, Andrew M.; Lawrence Livermore National Laboratory, University of California, Livermore, California, USA
|
| Quelle/Jahr | Multilayer structures and laboratory X-ray laser research: part of a four-conference program on X-ray optics:(1987), 76 - 80 |
| Schriftenreihe | Proceedings of SPIE: 688 |
| ISBN | 0-89252-723-4 |
| DOI | |
| Verlag | Bellingham, Wash.: SPIE |
| Konferenzangaben | SPIE's annual international technical symposium on optical and optoelectronic applied sciences and engineering, San Diego/Calif., 19-20, August, 1986, USA |
Zitierung
Kühne, M., Danzmann, K., Müller, P., Wende, B., Ceglio, N. M., Stearns, D. G., & Hawryluk, A. M. (1987). Characterization of multilayer structures for soft X-ray laser research. SPIE's annual international technical symposium on optical and optoelectronic applied sciences and engineering, San Diego/Calif., 19-20, August, 1986, USA. https://doi.org/10.1117/12.964825