| Zugriffsnummer | 45281 |
| Dokumenttyp | Konferenzartikel |
| Peer Review | mit Peer Review |
| Sprache | Englisch |
| Titel | Upgrade of the X-ray parallel beam facility XPBF 2.0 for characterization of silicon pore optics |
| Autor(in); Institution |
Handick, Evelyn; 7.2, Röntgenmesstechnik mit Synchrotronstrahlung, PTB-Berlin
Cibik, Levent; 7.2, Röntgenmesstechnik mit Synchrotronstrahlung, PTB-Berlin
Krumrey, Michael; 7.2, Röntgenmesstechnik mit Synchrotronstrahlung, PTB-Berlin
Müller, Peter; 7.2, Röntgenmesstechnik mit Synchrotronstrahlung, PTB-Berlin
Barrière, Nicolas; cosine measurement systems, Warmond, THE NETHERLANDS
Collon, Maximilien; cosine measurement systems, Warmond, THE NETHERLANDS
Hauser, Enrico; cosine measurement systems, Warmond, THE NETHERLANDS
Vacanti, Giuseppe; cosine measurement systems, Warmond, THE NETHERLANDS
Verhoeckx, Sjoerd; cosine measurement systems, Warmond, THE NETHERLANDS
Bavdaz, Marcos; European Space Agency, ESTEC, Noordwijk, THE NETHERLANDS
Wille, Eric; European Space Agency, ESTEC, Noordwijk, THE NETHERLANDS
|
| Quelle/Jahr | Space Telescopes and Instrumentation 2020: Ultraviolet to Gamma Ray:(2020), 8 S. |
| Artikelnummer | 114444G |
| Schriftenreihe | Proceedings of SPIE: 11444 |
| Herausgeber(in) |
den Herder, Jan-Willem A.
Nikzad, Shouleh
Nakazawa, Kazuhiro
|
| DOI | |
| Verlag | Bellingham, Wash.: SPIE |
| Konferenzangaben | SPIE Astronomical Telescopes + Instrumentation, Virtual Conference, 14-18 December 2020 |
| Freie Schlagworte | ATHENA ; Silicon Pore Optics ; Synchrotron Radiation ; XPBF |
| Zusammenfassung | The X-ray parallel beam facility XPBF 2.0 in the laboratory of the Physikalisch-Technische Bundesanstalt at the synchrotron radiation facility BESSY II provides a parallel beam of very low divergence, and adjustable beam accurate positioning of all silicon pore optic (SPO) sizes to be investigated, and a vertically movable CCD-based camera system to register the direct and the reflected beam at a sample to CCD distance of 12 m corresponding to the envisaged focal length of ATHENA (Advanced Telescope for High ENergy Astrophysics). Since its installation in 2016, the beamline has been constantly upgraded to improve performance and implementing the changing requirements. To accurately and constantly measure the 12 m distance between the center of the sample (i.e. mirror module) and the CCD detector, a laser tracker has been installed. Additionally, the cleanroom, housing the sample chamber, was upgraded with a cooling unit keeping the temperature at 20 °C. The original phosphor screen in front of the CCD will be replaced with a new phosphor screen with different grain size and material. An additional upgrade of the XPBF 2.0 is the installation of a new multilayer-coated mirror to operate the beamline at 1.0 keV instead of 1.6 keV. This paper will present the upgrades of the X-ray parallel beam facility XPBF 2.0 and discuss next steps characterizing SPOs with synchrotron radiation. |
| Themenbereich der Metrologie | Photometrie und Radiometrie |
Zitierung
Handick, E., Cibik, L., Krumrey, M., Müller, P., Barrière, N., Collon, M., Hauser, E., Vacanti, G., Verhoeckx, S., Bavdaz, M., & Wille, E. (2020). Upgrade of the X-ray parallel beam facility XPBF 2.0 for characterization of silicon pore optics. SPIE Astronomical Telescopes + Instrumentation, Virtual Conference, 14-18 December 2020. https://doi.org/10.1117/12.2561236