| Zugriffsnummer | 45267 |
| Dokumenttyp | Zeitschriftenartikel |
| Peer Review | mit Peer Review |
| Sprache | Englisch |
| Titel | Grazing emission X‐ray fluorescence: novel concepts and applications for nano‐analytics |
| Autor(in); Institution |
Baumann, Jonas; TU Berlin, Berlin, GERMANY
Kayser, Yves; 7.2, Röntgenmesstechnik mit Synchrotronstrahlung, PTB-Berlin
Kanngießer, Birgit; TU Berlin, Berlin, GERMANY
|
| Quelle/Jahr | Physica Status Solidi B: 258 (2021), 3, 17 S. |
| Artikelnummer | 2000471 |
| ISSN | 0370-1972 (PRINT) ; 1521-3951 (ONLINE) |
| DOI | |
| Verlag | Weinheim: WILEY-VCH |
| Freie Schlagworte | angle-resolved X-ray fluorescence ; area detectors ; elemental depth profiling ; nano analytics ; trace analyses |
| Zusammenfassung | Angle‐resolved X‐ray fluorescence spectroscopy gives access to elemental analysis of nanoscaled materials. The two main techniques of this method are grazing incidence X‐ray fluorescence (GIXRF) and grazing emission X‐ray fluorescence (GEXRF) spectroscopy. Principles of both techniques including main applications are discussed in this Review. The main focus lies on the description of GEXRF technique and its new analytical possibilities in the nano‐world |
| Kostenfreier Zugang | Open Access Hybrid |
| Rechteinformation | CC BY 4.0 ; Creative Commons Attribution 4.0 License |
| Themenbereich der Metrologie | Photometrie und Radiometrie |