| Zugriffsnummer | 45255 |
| Dokumenttyp | Zeitschriftenartikel |
| Peer Review | mit Peer Review |
| Sprache | Englisch |
| Titel | Transport and noise properties of sub-100-nm planar Nb Josephson junctions with metallic Hf-Ti barriers for nano-SQUID applications |
| Autor(in); Institution |
Morosh, Viacheslav; 2.4, Quantenelektronik, PTB-Braunschweig
Linek, J.; University of Tübingen, Tübingen, GERMANY
Müller, B.; University of Tübingen, Tübingen, GERMANY
Martínez-Pérez, M.J.; University of Tübingen, Tübingen, GERMANY
Wolter, Silke; 2.4, Quantenelektronik, PTB-Braunschweig
Weimann, Thomas; 2.4, Quantenelektronik, PTB-Braunschweig
Beyer, Jörn; 7.6, Kryosensorik, PTB-Berlin
Schurig, Thomas; 7.6, Kryosensorik, PTB-Berlin
Kieler, Oliver; 2.4, Quantenelektronik, PTB-Braunschweig
Zorin, A.B.; 2.4, Quantenelektronik, PTB-Braunschweig
Kleiner, R.; University of Tübingen, Tübingen, GERMANY
Koelle, D.; University of Tübingen, Tübingen, GERMANY
|
| Quelle/Jahr | Physical Review Applied: 14 (2020), 5, 12 S. |
| Artikelnummer | 054072 |
| Availability | [online only] |
| ISSN | 2331-7019 |
| DOI | |
| Verlag | New York, NY: American Physical Society |
| Zusammenfassung | We analyze electric transport and noise properties at 4.2 K of self-shunted superconductor-normal metal-superconductor (SNS) sandwich-type Josephson junctions, comprising Nb as the superconductor and Hf-Ti as the normal conducting material, with lateral dimensions down to approximately 80 nm. The junctions are fabricated with an optimized multilayer Nb technology based on nanopatterning by electron-beam lithography and chemical-mechanical polishing. The dependence of transport properties on the junction geometry (lateral size and barrier thickness dHf-Ti) is studied, yielding a characteristic voltage Vc up to approximately 100 μV for the smallest dHf-Ti = 17 nm. The observed small hysteresis in the current-voltage curves of devices with high Vc and large size can be attributed to self-heating of the junctions and fitted with an extended version of the resistively shunted junction model. Measurements of voltage noise of single junctions are consistent with the model including self-heating effects. The potential of our technology for further miniaturization of nanoscale superconducting quantum interference devices and for the improvement of their performance is discussed. |
| Themenbereich der Metrologie | Ionisierende Strahlung |
Zitierung
Morosh, V., Linek, J., Müller, B., Martínez-Pérez, M., Wolter, S., Weimann, T., Beyer, J., Schurig, T., Kieler, O., Zorin, A., Kleiner, R., & Koelle, D. (2020). Transport and noise properties of sub-100-nm planar Nb Josephson junctions with metallic Hf-Ti barriers for nano-SQUID applications. Physical Review Applied, 14(5), 12 S. https://doi.org/10.1103/physrevapplied.14.054072