| Zugriffsnummer | 45217 |
| Dokumenttyp | Konferenzartikel |
| Peer Review | mit Peer Review |
| Sprache | Englisch |
| Titel | Pulse power measurements and attenuator characterization of the hard X-ray beamline at the Linac Coherent Light Source |
| Autor(in); Institution |
Song, Sanghoon; Linac Coherent Light Source, Menlo Park, USA
Alonso-Mori, Roberto; Linac Coherent Light Source, Menlo Park, USA
Chollet, Matthieu; Linac Coherent Light Source, Menlo Park, USA
Feng, Yiping; Linac Coherent Light Source, Menlo Park, USA
Glownia, James M.; Linac Coherent Light Source, Menlo Park, USA
Lemke, Henrik T.; Linac Coherent Light Source, Menlo Park, USA
Sikorski, Marcin; Linac Coherent Light Source, Menlo Park, USA
Zhu, Diling; Linac Coherent Light Source, Menlo Park, USA
Moeller, Stefan; Linac Coherent Light Source, Menlo Park, USA
Lee, Hae Ja; Linac Coherent Light Source, Menlo Park, USA
Hunter, Mark S.; Linac Coherent Light Source, Menlo Park, USA
Carini, Gabriella; Brookhaven National Laboratory, Upton, NY, USA
Tiedtke, Kai; Deutsches Elektronen-Synchrotron, Hamburg, GERMANY
Jastrow, Ulf; Deutsches Elektronen-Synchrotron, Hamburg, GERMANY
Sorokin, Andrey; Deutsches Elektronen-Synchrotron, Hamburg, GERMANY
Richter, Mathias; 7, Temperatur und Synchrotronstrahlung, PTB-Berlin
Owada, Shigeki; RIKEN, Hyogo, JAPAN
Tono, Kensuke; RIKEN, Hyogo, JAPAN
Saito, Norio; RIKEN, Hyogo, JAPAN
Tanaka, Takahiro; RIKEN, Hyogo, JAPAN
Kato, Masahiro; RIKEN, Hyogo, JAPAN
Yabashi, Makina; RIKEN, Hyogo, JAPAN
Robert, Aymeric; Linac Coherent Light Source, Menlo Park, USA
|
| Quelle/Jahr | X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation V:(2019), 1 - 7 |
| Artikelnummer | 1103810 |
| Schriftenreihe | Proceedings of SPIE: 11038 |
| Availability | [online only] |
| Herausgeber(in) |
Tschentscher, Thomas
Patthey, Luc
Tiedtke, Kai
Zangrando, Marco
|
| ISBN | 978-1-5106-2743-7 |
| DOI | |
| Verlag | Bellingham, Wash.: SPIE |
| Konferenzangaben | SPIE Optics + Optoelectronics, Prague, 1 - 4 April 2019, Czech Republic |
| Freie Schlagworte | XFEL ; Hard X-ray ; Intensity monitor ; optical laser power meter |
| Zusammenfassung | The absolute power of the Linac Coherent Light Source pulses has been measured accurately in the hard X-ray beamline by using simultaneously two detectors: an X-ray Gas Monitor Detector (XGMD)² in tandem with a radiometer. From these measurements, we were also able to characterize and calibrate in details our sets of beamline attenuators, in addition to extending an absolute calibration for our beamline intensity monitors. Similarly, we demonstrate that commercial optical power meter has a response in the hard X-ray regime, that can be cross-correlated with the absolute power of the LCLS beam. |
| Themenbereich der Metrologie | Photometrie und Radiometrie |
Zitierung
Song, S., Alonso-Mori, R., Chollet, M., Feng, Y., Glownia, J. M., Lemke, H. T., Sikorski, M., Zhu, D., Moeller, S., Lee, H. J., Hunter, M. S., Carini, G., Tiedtke, K., Jastrow, U., Sorokin, A., Richter, M., Owada, S., Tono, K., Saito, N., Tanaka, T., Kato, M., Yabashi, M., & Robert, A. (2019). Pulse power measurements and attenuator characterization of the hard X-ray beamline at the Linac Coherent Light Source. SPIE Optics + Optoelectronics, Prague, 1 - 4 April 2019, Czech Republic. https://doi.org/10.1117/12.2520827