| Zugriffsnummer | 44800 |
| Dokumenttyp | Zeitschriftenartikel |
| Peer Review | mit Peer Review |
| Sprache | Englisch |
| Titel | Uncertainty analysis of stray field measurements by quantitative magnetic force microscopy |
| Autor(in); Institution |
Hu, Xiukun; 5.2, Dimensionelle Nanometrologie, PTB-Braunschweig
Dai, Gaoliang; 5.2, Dimensionelle Nanometrologie, PTB-Braunschweig
Sievers, Sibylle; 2.5, Halbleiterphysik und Magnetismus, PTB-Braunschweig
Fernández Scarioni, Alexander; 2.5, Halbleiterphysik und Magnetismus, PTB-Braunschweig
Neu, Volker; Leibniz IFW Dresden, Dresden, GERMANY
Bieler, Mark; 2.4, Quantenelektronik, PTB-Braunschweig
Schumacher, Hans Werner; 2.5, Halbleiterphysik und Magnetismus, PTB-Braunschweig
|
| Quelle/Jahr | IEEE Transactions on Instrumentation and Measurement: 69 (2020), 10, 8187 - 8195 |
| ISSN | 0018-9456 (PRINT) ; 1557-9662 (ONLINE) |
| DOI | |
| Verlag | New York, NY: IEEE |
| Freie Schlagworte | Uncertainty ; Magnetic field measurement ; deconvolution ; magnetic force microscopy ; magnetic fields ; uncertainty ; Wiener filtering |
| Zusammenfassung | Magnetic force microscopy (MFM) measurements generally provide phase images which represent the signature of domain structures on the surface of nanomaterials. To quantitatively determine magnetic stray fields based on an MFM image requires calibrated properties of the magnetic tip. In this work, an approach is employed for calibrating a magnetic tip using a Co/Pt multilayered film as a reference sample which shows stable well-known magnetic properties and well-defined perpendicular band domains. The approach is based on a regularized deconvolution process in Fourier domain with a Wiener filter and the L-curve method for determining a suitable regularization parameter to get a physically reasonable result. The calibrated tip is applied for a traceable quantitative determination of the stray fields of a test sample which has a spatial frequency spectrum covered by that of the reference sample. According to the “Guide to the expression of uncertainty in measurement”, uncertainties of the processing algorithm are estimated considering the fact that the regularization influences significantly the quantitative analysis. We discuss relevant uncertainty components and their propagations between real domain and Fourier domain for both, the tip calibration procedure and the stray field calculation, and propose an uncertainty evaluation procedure for quantitative magnetic force microscopy. |
| Themenbereich der Metrologie | Elektrizität und Magnetismus |
| Forschungsprojekt | 15SIB06: NanoMag: Nano-scale traceable magnetic field measurements |
| Förderinformationen (1) |
Förderername: European Commission (EC)
Förderer ID: 0000 0001 2242 8989 Förderer ID Typ: ISNI Förderprogramm: EMPIR 2015 SI Broader Scope Titel der Förderung: 15SIB06: NanoMag: Nano-scale traceable magnetic field measurements Förderungsnummer: 15SIB06 |
Zitierung
Hu, X., Dai, G., Sievers, S., Fernández Scarioni, A., Neu, V., Bieler, M., & Schumacher, H. W. (2020). Uncertainty analysis of stray field measurements by quantitative magnetic force microscopy. IEEE Transactions on Instrumentation and Measurement, 69(10), 8187–8195. https://doi.org/10.1109/tim.2020.2986865