| Zugriffsnummer | 44757 |
| Dokumenttyp | Konferenzartikel |
| Peer Review | unbekannt |
| Sprache | Englisch |
| Titel | Ultrafast waveform metrology: A first international comparison |
| Autor(in); Institution |
Bieler, Mark; 2.4, Quantenelektronik, PTB-Braunschweig
Struszewski, Paul; 2.5, Halbleiterphysik und Magnetismus, PTB-Braunschweig
Feldman, Ari; National Institute of Standards and Technology (NPL), Boulder, USA
Jargon, Jeffrey; National Institute of Standards and Technology (NPL), Boulder, USA
Hale, Paul; National Institute of Standards and Technology (NPL), Boulder, USA
Gong, Pengwei; Beijing Institute of Radio Metrology and Measurement, Beijing, CHINA
Xie, Wen; Beijing Institute of Radio Metrology and Measurement, Beijing, CHINA
Chuntao, Yang; Beijing Institute of Radio Metrology and Measurement, Beijing, CHINA
Zhigang, Feng; National Institute of Metrology, Beijing, CHINA
Kejia, Zhao; National Institute of Metrology, Beijing, CHINA
Zhijun, Yang; National Institute of Metrology, Beijing, CHINA
|
| Quelle/Jahr | 2020 Conference on Precision Electromagnetic Measurements (CPEM):(2020), 414 - 415 |
| ISSN | 2160-0171 (ONLINE) ; 0589-1485 (POD) |
| ISBN | 978-1-7281-5898-3 (PDF) ; 978-1-7281-5899-0 (PoD) |
| DOI | |
| Verlag | New York, NY: IEEE |
| Konferenzangaben | Conference on Precision Electromagnetic Measurements (CPEM), Virtual Conference, 24-28, August, 2020, USA |
| Freie Schlagworte | Waveform metrology ; photodiodes ; electro-optic sampling ; ultrashort voltage pulses |
| Zusammenfassung | We report on the first international comparison in ultrafast waveform metrology. To this end, the frequency and time responses of a photodiode with a nominal bandwidth of 100 GHz have been measured by several National Metrology Institutes (NMIs) during the last two years. An overall good agreement between the different measurement techniques is obtained. However, certain features in the frequency- and time-domain responses are not reproduced by all NMIs, calling for additional studies and comparisons. |
| Themenbereich der Metrologie | Elektrizität und Magnetismus |
| Förderinformationen (1) |
Förderername: Deutsche Forschungsgemeinschaft (DFG)
Förderer ID: 0000 0001 2096 9829 Förderer ID Typ: ISNI Titel der Förderung: NANOMET: Metrology for Complex Nanosystems Förderungsnummer: GrK1952/1 |
Zitierung
Bieler, M., Struszewski, P., Feldman, A., Jargon, J., Hale, P., Gong, P., Xie, W., Chuntao, Y., Zhigang, F., Kejia, Z., & Zhijun, Y. (2020). Ultrafast waveform metrology: A first international comparison. Conference on Precision Electromagnetic Measurements (CPEM), Virtual Conference, 24-28, August, 2020, USA. https://doi.org/10.1109/cpem49742.2020.9191926