Zugriffsnummer 44747
Dokumenttyp Konferenzartikel in Zeitschrift Open Access Gold
Peer Review ohne Peer Review
Sprache Englisch
Titel Characterization progress of a UV-microscope recently implemented at the PTB Nanometer Comparator for uni- and bidirectional measurements
Autor(in); Institution
Krüger, Jan; 4.2, Bild- und Wellenoptik, PTB-Braunschweig; 5.2, Dimensionelle Nanometrologie, PTB-Braunschweig
Xu, Han; 4.2, Bild- und Wellenoptik, PTB-Braunschweig
Köning, Rainer; 5.2, Dimensionelle Nanometrologie, PTB-Braunschweig
Bodermann, Bernd; 4.2, Bild- und Wellenoptik, PTB-Braunschweig
Quelle/Jahr EPJ Web of Conferences: 238 (2020), 1 - 2
Artikelnummer 06010
Availability [online only]
ISSN 2100-014X
DOI
Verlag Les Ulis: EDP Sciences
Konferenzangaben European Optical Society Annual Meeting 2020 (virtual), Virtual Conference, 07-11, September, 2020
Freie Schlagworte UV- Microscopy ; Optical bidirectional measurements
Zusammenfassung In this contribution, we emphasize the need for a sophisticated characterization of measurement devices in particular for optical bidirectional measurements. As an example, the ongoing characterization of the UV-microscope at PTB’s linescale comparator is presented. First results of spectroscopic measurements of the employed UV-LED are presented and the impact of deviations in the center wavelength of the LED on the measurements are illustrated by rigorous simulations.
Kostenfreier Zugang Open Access Gold
Rechteinformation CC BY 4.0 ; Creative Commons Attribution 4.0 License
Themenbereich der Metrologie Nanometrologie
Forschungsprojekt Flankierende Maßnahme der PTB (Abteilungen 4 und 5): Optische bidirektionale Messungen

Zitierung

Krüger, J., Xu, H., Köning, R., & Bodermann, B. (2020). Characterization progress of a UV-microscope recently implemented at the PTB Nanometer Comparator for uni- and bidirectional measurements. EPJ Web of Conferences, 238, 1–2. https://doi.org/10.1051/epjconf/202023806010

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