| Zugriffsnummer | 44304 |
| Dokumenttyp | Konferenzartikel |
| Peer Review | unbekannt |
| Sprache | Englisch |
| Titel | Emissivity measurement of semitransparent samples |
| Autor(in); Institution |
Gieseler, Julian; 7.3, Detektorradiometrie und Strahlungsthermometrie, PTB-Berlin
Adibekyan, Albert; 7.3, Detektorradiometrie und Strahlungsthermometrie, PTB-Berlin
Monte, Christian; 7.3, Detektorradiometrie und Strahlungsthermometrie, PTB-Berlin
Hollandt, Jörg; 7.3, Detektorradiometrie und Strahlungsthermometrie, PTB-Berlin
|
| Quelle/Jahr | Proceedings SMSI 2020 Conference Sensor and Measurement Science International:(2020), 173 - 174 |
| Availability | [online-only] |
| Herausgeber(in) |
AMA Service GmbH
|
| ISBN | 978-3-9819376-2-6 |
| DOI | |
| URL | |
| Verlag | Wunstorf: AMA Service GmbH |
| Konferenzangaben | Sensor and Measurement Science International Conference, SMSI 2020 (cancelled), Nürnberg, Deutschland |
| Freie Schlagworte | emissivity measurement ; semitransparent materials ; radiative transport ; silicon ; infrared optical properties |
| Zusammenfassung | The characterization of infrared optical properties of semitransparent samples between 6 µm and 25 µm and between 20 °C and 90 °C is hampered by the fact, that the apparent emittance, reflectance and transmittance are intertwined in the optical signals. We report on an approach for the simultaneous measurement of transmittance and reflectance of semitransparent samples, expanding PTB’s established emissivity measurement facilities under air and under vacuum. Measurements of silicon were performed under air, evaluated, and, additionally, validated by independent measurements. [Conference did not take place because of Covid-19 virus pandemic, but the proceedings were published.] |
