Zugriffsnummer 44296
Dokumenttyp Zeitschriftenartikel
Peer Review mit Peer Review
Sprache Englisch
Titel Multilayer ion trap with three-dimensional microwave circuitry for scalable quantum logic applications
Autor(in); Institution
Hahn, Henning; QUEST Institute for Experimental Quantum Metrology, PTB-Braunschweig
Zarantonello, Giorgio; Leibniz Universität, Institut für Quantenoptik, Hannover, GERMANY; QUEST Institute for Experimental Quantum Metrology, PTB-Braunschweig
Bautista-Salvador, Amado; QUEST Institute for Experimental Quantum Metrology, PTB-Braunschweig
Wahnschaffe, Martina; PTB-Braunschweig, formerly
Kohnen, Matthias; PTB-Braunschweig, formerly
Schoebel, J.; Technische Universität Braunschweig, Department for High-Frequency Technology, Braunschweig, GERMANY
Schmidt, Piet O.; QUEST Institute for Experimental Quantum Metrology, PTB-Braunschweig; Leibniz Universität, Institut für Quantenoptik, Hannover, GERMANY
Ospelkaus, Christian; QUEST Institute for Experimental Quantum Metrology, PTB-Braunschweig; Leibniz Universität, Institut für Quantenoptik, Hannover, GERMANY
Quelle/Jahr Applied Physics B: 125 (2019), 154, 1 - 10
ISSN 0946-2171 (PRINT) ; 1432-0649 (ONLINE)
DOI
URL
Verlag Berlin [u.a.]: Springer
Freie Schlagworte Multilayer surface-electrode ion trap ; Quantum logic ; Electromagnetic full-wave simulation ; Trapped ions ; Quantum machine
Zusammenfassung We present a multilayer surface-electrode ion trap with embedded 3D microwave circuitry for implementing entangling quantum logic gates. We discuss the electromagnetic full-wave simulation procedure that has led to the trap design and the characterization of the resulting microwave field pattern using a single ion as a local field probe. The results agree with simulations within the uncertainty; compared to previous traps, this design reduces detrimental AC Zeeman shifts by three orders of magnitude. The design presented here can be viewed as an entangling gate component in a library for surface-electrode ion traps intended for quantum logic operations.
Themenbereich der Metrologie Zeit und Frequenz

Zitierung

Hahn, H., Zarantonello, G., Bautista-Salvador, A., Wahnschaffe, M., Kohnen, M., Schoebel, J., Schmidt, P. O., & Ospelkaus, C. (2019). Multilayer ion trap with three-dimensional microwave circuitry for scalable quantum logic applications. Applied Physics B, 125(154), 1–10. https://doi.org/10.1007/s00340-019-7265-1

Exportieren

PTB-Publica Menü

Sprache wechseln: uk flag