| Zugriffsnummer | 44194 |
| Dokumenttyp | Zeitschriftenartikel |
| Peer Review | mit Peer Review |
| Sprache | Englisch |
| Titel | Micro-force measurements: a new instrument at METAS |
| Autor(in); Institution |
Marti, Kilian; Federal Institute of Metrology METAS, Bern-Wabern, SWITZERLAND
Wuethrich, Christian; Federal Institute of Metrology METAS, Bern-Wabern, SWITZERLAND
Aeschbacher, Manuel; Federal Institute of Metrology METAS, Bern-Wabern, SWITZERLAND
Russi, Stefan; Federal Institute of Metrology METAS, Bern-Wabern, SWITZERLAND
Brand, Uwe; 5.1, Oberflächenmesstechnik, PTB-Braunschweig
Li, Zhi; 5.1, Oberflächenmesstechnik, PTB-Braunschweig
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| Quelle/Jahr | Measurement Science and Technology: 31 (2020), 7, 1 - 13 |
| Artikelnummer | 075007 |
| ISSN | 0957-0233 (PRINT) ; 1361-6501 (ONLINE) |
| DOI | |
| Verlag | Bristol: IOP Publishing |
| Freie Schlagworte | Microforce sensor ; Si traceable force calibration ; Electromagnetic force compensation |
| Zusammenfassung | We designed and developed a new instrument for calibrating micro-force sensors. The calibration is traceable to the SI unit of mass and is realised from 1 μN to 60 mN by means of electromagnetic force compensation of a balance. The expanded measurement uncertainty of our instrument is 0.125 μN absolute and 2700 ppm relative. We verified our instrument in a bilateral comparison between METAS and PTB. The degrees of equivalence of the two institutes are in excellent agreement. |
| Themenbereich der Metrologie | Nanometrologie |