Zugriffsnummer 44037
Dokumenttyp Konferenzartikel in Zeitschrift
Peer Review mit Peer Review
Sprache Englisch
Titel Externally referenced current source with stability down to 1 nA/A at 50 mA
Autor(in); Institution
Fan, Isaac; 8.2, Biosignale, PTB-Berlin
Behr, Ralf; 2.6, Elektrische Quantenmetrologie, PTB-Braunschweig
Drung, Dietmar; 7.6, Kryosensorik, PTB-Berlin
Krause, Christian; 7.2, Kryophysik und Spektrometrie, PTB-Berlin
Götz, Martin; 2.6, Elektrische Quantenmetrologie, PTB-Braunschweig
Pesel, Eckart; 2.6, Elektrische Quantenmetrologie, PTB-Braunschweig
Scherer, Hansjörg; 2.6, Elektrische Quantenmetrologie, PTB-Braunschweig
Quelle/Jahr 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018), Full Digest. IEEE Transactions on Instrumentation and Measurement: 68 (2018), 6, 2129 - 2135
ISSN 0018-9456 (PRINT) ; 1557-9662 (ONLINE)
DOI
Verlag Piscataway, NJ: IEEE
Konferenzangaben Conference on Precision Electromagnetic Measurements ; CPEM 2018, Paris, 08-13, July, 2018, France
Freie Schlagworte Resistors ; Thermal stability ; Circuit stability ; Voltage measurement ; Servomotors ; Current measurement ; Voltage control
Zusammenfassung The noise and stability of a current source are limited by the quality of components used for construction, such as the voltage reference chips, resistors, and power supplies. A state-of-the-art commercial current source typically exhibits a stability no better than parts in 107. In this paper, we present a way to implement a current source with “external” electrical references. This approach allows the current source stability to be decoupled from the noise characteristics of the main power supply circuit. Stability of about a few parts in 109 in a day has been reached at 50 mA, representing the most stable current source at the milliampere range to date.
Themenbereich der Metrologie Metrologie in der Medizin

Zitierung

Fan, I., Behr, R., Drung, D., Krause, C., Götz, M., Pesel, E., & Scherer, H. (2018). Externally referenced current source with stability down to 1 nA/A at 50 mA. IEEE Transactions on Instrumentation and Measurement, 68(6), 2129–2135. https://doi.org/10.1109/tim.2018.2885502

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