Zugriffsnummer 43763
Dokumenttyp Buchartikel
Peer Review unbekannt
Sprache Englisch
Titel Chapter 3.2.2 - Small angle x-ray scattering (SAXS)
Autor(in); Institution
Krumrey, Michael; 7.2, Röntgenmesstechnik mit Synchrotronstrahlung, PTB-Berlin
Quelle/Jahr Characterization of Nanoparticles: Measurement Processes for Nanoparticles:(2019), 173 - 183
Herausgeber(in)
Hodoroaba, Vasile-Dan
Unger, Wolfgang E.S.
Shard, Alexander G.
ISBN 978-0-12-814182-3 (print) ; 978-0-12-814183-0 (online)
URL
Verlag Amsterdam [u.a.]: Elsevier
Freie Schlagworte Small angle x-ray scattering ; SAXS ; Nanoparticle size ; Size distribution ; Concentration ; Nanotechnology
Zusammenfassung This chapter provides an introduction to small angle x-ray scattering for the characterization of nanoparticles. The basic principles and the instrumentation are described before the determination of the most relevant parameters is discussed. These parameters are the size, especially the mean particle diameter for spherical particles, the size distribution width, and the number concentration of nanoparticles in liquid suspensions. Standardization in the field is touched upon, and examples for achievable uncertainties are provided. Finally, dedicated investigations of core–shell nanoparticles are presented.
Themenbereich der Metrologie Photometrie und Radiometrie

Zitierung

Krumrey, M. (2019). Chapter 3.2.2 - Small angle x-ray scattering (SAXS). In V.-D. Hodoroaba, W. E. Unger, & A. G. Shard (Eds.), Characterization of Nanoparticles: Measurement Processes for Nanoparticles (pp. 173–183). Amsterdam [u.a.]: Elsevier.

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