| Zugriffsnummer | 43741 |
| Dokumenttyp | Zeitschriftenartikel |
| Peer Review | mit Peer Review |
| Sprache | Englisch |
| Titel | Nanoparticle characterization - supplementary comparison on nanoparticle size |
| Autor(in); Institution |
Lin, H.-L.; Centre for Measurement Standards (CMS), Industrial Technology Research Institute (ITRI), Taiwan, CHINA
Fu, W.-E.; Centre for Measurement Standards (CMS), Industrial Technology Research Institute (ITRI), Taiwan, CHINA
Weng, H.-F.; Centre for Measurement Standards (CMS), Industrial Technology Research Institute (ITRI), Taiwan, CHINA
Misumi, I.; National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), Ibaraki, JAPAN
Sugawara, K.; National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), Ibaraki, JAPAN
Gonda, S.; National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), Ibaraki, JAPAN
Takahashi, K.; National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), Ibaraki, JAPAN
Takahata, K.; National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), Ibaraki, JAPAN
Ehara, K.; National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), Ibaraki, JAPAN
Takatsuji, T.; National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), Ibaraki, JAPAN
Fujimoto, T.; National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), Ibaraki, JAPAN
Salas, J.; Centro Nacional de Metrologia (CENAM), Queretaro, MEXICO
Dirscherl, K.; Danish National Metrology Institute (DFM), Lyngby, DENMARK
Garnaes, J.; Danish National Metrology Institute (DFM), Lyngby, DENMARK
Damasceno, J.; Instituto Nacional de Metrologia, Qualidade e Tecnologia (Inmetro), Xerem, Duque de Caxias, BRAZIL
de Oliveira, J. C. V.; Instituto Nacional de Metrologia, Qualidade e Tecnologia (Inmetro), Xerem, Duque de Caxias, BRAZIL
Emanuele, E.; Istituto Nazionale di Ricerca Metrologica (INRIM), Torino, ITALY
Picotto, G. B.; Istituto Nazionale di Ricerca Metrologica (INRIM), Torino, ITALY
Kim, C. S.; Korea Research Institute of Standards and Science (KRISS), Yuseong-Gu, Daejon, REPUBLIC OF KOREA
Cho, S. J.; Korea Research Institute of Standards and Science (KRISS), Yuseong-Gu, Daejeon, REPUBLIC OF KOREA
Motzkus, C.; Laboratoire National de métrologie et d'essais (LNE), Paris, FRANCE
Meli, F.; Federal Institute of Metrology METAS, Bern-Wabern, SWITZERLAND
Gao, S.; National Institute of Metrology (NIM), Beijing, CHINA
Shi, Y.; National Institute of Metrology (NIM), Beijing, CHINA
Liu, J.; National Institute of Metrology (NIM), Beijing, CHINA
Jämting, Å. K.; National Measurement Institute Australia (NMIA), West Lindfield, AUSTRALIA
Catchpoole, H. J.; National Measurement Institute Australia (NMIA), West Lindfield, AUSTRALIA
Lawn, M. A.; National Measurement Institute Australia (NMIA), West Lindfield, AUSTRALIA
Herrmann, J.; National Measurement Institute Australia (NMIA), West Lindfield, AUSTRALIA
Coleman, V. A.; National Measurement Institute Australia (NMIA), West Lindfield, AUSTRALIA
Adlem, L.; National Metrology Institute of South Africa (NMISA), Lynnwood Ridge, SOUTH AFRICA
Kruger, O. A.; National Metrology Institute of South Africa (NMISA), Lynnwood Ridge, SOUTH AFRICA
Buajarern, J.; National Institute of Metrology (NIMT, Thailand), Klong Luang, THAILAND
Buhr, Egbert; 4.2, Bild- und Wellenoptik, PTB-Braunschweig
Danzebrink, Hans-Ulrich; 5.2, Dimensionelle Nanometrologie, PTB-Braunschweig
Krumrey, Michael; 7.2, Röntgenmesstechnik mit Synchrotronstrahlung, PTB-Berlin
Bosse, Harald; 5, Fertigungsmesstechnik, PTB-Braunschweig
|
| Quelle/Jahr | Metrologia: 56 (2019), 1A, Tech. Suppl. |
| Artikelnummer | 04004 |
| ISSN | 0026-1394 (PRINT) ; 1681-7575 (ONLINE) |
| DOI | |
| Verlag | Bristol: IOP Publishing |
| Freie Schlagworte | Nanoparticles ; Atomic Force Microscopy (AFM) ; Transmission Electron Microscopy (TEM) ; Scanning Electron Microscopy (SEM) ; Dynamic Light Scattering (DLS) ; Differential Mobility Analyzer (DMA) ; mall Angle X-Ray Scattering |
| Zusammenfassung | Nanoparticles with size in the range from 10 nm to 300 nm and from three different materials (Au 10 nm, Ag 20 nm, and PSL 30 nm, 100 nm and 300 nm) were used in this supplementary comparison. The selected nanoparticles meet the requirements of different measurement methods such as Atomic Force Microscopy (AFM), Transmission Electron Microscopy (TEM), Scanning Electron Microscopy (SEM), Dynamic Light Scattering (DLS), and Differential Mobility Analyzer (DMA), Small Angle X-Ray Scattering and for forth. All 37 participating laboratories returned results, but not all laboratories were able to perform measurement of all 5 nanoparticles. In order to determine the degree of equivalence (DOE), two reference values were considered in this comparison: the method dependent reference value (MRV) and the global reference value (GRV). The MRVs were determined for different measurement methods according to the corresponding reported uncertainties and measurement values from the participants. Each measurement method owns its own MRV. Since the measurement data from DLS were very different from and inconsistent with the measurement data from the other methods, the MRV for DLS was used in the En number calculation for the measurement data reported from the DLS method. The GRV was determined from the MRVs and their uncertainties of all the measurement methods except DLS, and was applied in the En number calculations for the measurement data reported from AFM, EM, DMA and SAXS methods. The assumption that the particles are spherical was commonly made in the nanoparticle measurements. Non-sphericity of particles, if exists, could have different impacts on different measurement methods. It is also important to note that the methods used are measuring mean diameters of a population of particles, not just a single particle, and that the meaning of the mean diameter could differ for different methods. Probably if participants include a different specific contribution in the uncertainty in a harmonized way, taking the non-cancelled method-dependent "systematic" errors into account, it may be easier to compare the results. |
Zitierung
Lin, H.-L., Fu, W.-E., Weng, H.-F., Misumi, I., Sugawara, K., Gonda, S., Takahashi, K., Takahata, K., Ehara, K., Takatsuji, T., Fujimoto, T., Salas, J., Dirscherl, K., Garnaes, J., Damasceno, J., de Oliveira, J. C. V., Emanuele, E., Picotto, G. B., Kim, C. S., Cho, S. J., Motzkus, C., Meli, F., Gao, S., Shi, Y., Liu, J., Jämting, Å. K., Catchpoole, H. J., Lawn, M. A., Herrmann, J., Coleman, V. A., Adlem, L., Kruger, O. A., Buajarern, J., Buhr, E., Danzebrink, H.-U., Krumrey, M., & Bosse, H. (2019). Nanoparticle characterization - supplementary comparison on nanoparticle size. Metrologia, 56(1A, Tech. Suppl.). https://doi.org/10.1088/0026-1394/56/1a/04004