| Zugriffsnummer | 43383 |
| Dokumenttyp | Konferenzartikel in Zeitschrift |
| Peer Review | mit Peer Review |
| Sprache | Englisch |
| Titel | Asynchronous optical sampling for laser-based vector network analysis on coplanar waveguides |
| Autor(in); Institution |
Struszewski, Paul; 2.5, Halbleiterphysik und Magnetismus, PTB-Braunschweig
Bieler, Mark; 2.5, Halbleiterphysik und Magnetismus, PTB-Braunschweig
|
| Quelle/Jahr | IEEE Transactions on Instrumentation and Measurement: 68 (2018), 6, 2295 - 2302 |
| ISSN | 0018-9456 (PRINT) ; 1557-9662 (ONLINE) |
| DOI | |
| Verlag | New York, NY: IEEE |
| Konferenzangaben | Conference on Precision Electromagnetic Measurements ; CPEM 2018, Paris, 08-13, July, 2018, France |
| Freie Schlagworte | Electro-optic sampling ; ultrashort voltage pulses ; vector network analysis ; waveform metrology |
| Zusammenfassung | We employ asynchronous optical sampling to realize a laser-based vector network analyzer for the measurement of complex electrical reflection coefficients. This sampling method utilizes two separate femtosecond lasers for the generation and detection of ultrashort voltage pulses on a waveguide structure and does not require any optical delay lines. The scheme allows us to increase the measurement epoch, enabling a frequency resolution of 76MHz while simultaneously covering a broad frequency range up to approximately 500 GHz. Our analysis comprises a direct comparison with measurements from a conventional synchronous optical sampling technique. We obtain a very good agreement between the two measurement methods. However, asynchronous sampling reveals a four-times higher frequency resolution and shows a reduced residual systematic error. In addition, we investigate different laser stabilization methods utilizing laser-pulse-cross-correlation measurements. Our analysis reveals a temporal jitter of better than 46 fs with the possibility to use one free-running laser oscillator. |
| Themenbereich der Metrologie | Elektrizität und Magnetismus |