| Zugriffsnummer | 43002 |
| Dokumenttyp | Konferenzartikel |
| Peer Review | mit Peer Review |
| Sprache | Englisch |
| Titel | X-ray reflectometry of a platinum coating as reference sample for the ATHENA coating development |
| Autor(in); Institution |
Jafari, Atefeh; DTU Space, DENMARK
Christensen, Finn E.; DTU Space, DENMARK
Massahi, S.; DTU Space, DENMARK
Svendsen, Sara; DTU Space, DENMARK
Vu, L. M.; DTU Space, DENMARK
Henriksen, Peter L.; DTU Space, DENMARK
Shortt, Brian; European Space Agency, THE NETHERLANDS
Krumrey, Michael; 7.2, Röntgenmesstechnik mit Synchrotronstrahlung, PTB-Berlin
Cibik, Levent; 7.2, Röntgenmesstechnik mit Synchrotronstrahlung, PTB-Berlin
Handick, Evelyn; 7.2, Röntgenmesstechnik mit Synchrotronstrahlung, PTB-Berlin
Ferreira, Desirée D. M.; DTU Space, DENMARK
|
| Quelle/Jahr | Optics for EUV, X-Ray, and Gamma-Ray Astronomy IX:(2019), 111191K-1 - 111191K-7 |
| Schriftenreihe | Proceedings of SPIE: 11119 |
| Availability | [online only] |
| Herausgeber(in) |
O'Dell, Stephen L.
Pareschi, Giovanni
|
| ISSN | 0277-786X (PRINT) ; 1996-756X (ONLINE) |
| ISBN | 978-1-5106-2932-5 ; 978-1-5106-2931-8 |
| DOI | |
| Verlag | Bellingham, Wash.: SPIE |
| Konferenzangaben | Optics for EUV, X-Ray, and Gamma-Ray Astronomy IX, San Diego, California, 13-15, August, 2019, United States of America |
| Zusammenfassung | X-ray reflectivity characterization of X-ray mirrors is an essential step in designing space telescopes and instruments. We report on production and characterization of platinum thin films coated on flat glass substrates for evaluating measurement results obtained using several X-ray reflectometry (XRR) systems. The main objective of this study is to compare the XRR results measured using facilities at DTU Space and the four-crystal monochromator (FCM) beamline of PTB at the synchrotron radiation facility BESSY II for the Advanced Telescope for High-ENergy Astrophysics (ATHENA) mission funded by the European Space Agency, ESA. This sample probably can be used as a reference sample for testing similar measurements at the other XRR facilities. The stability of platinum thin films and the effect of the substrate quality on the reflectivity performance are investigated. |
| Themenbereich der Metrologie | Photometrie und Radiometrie |
Zitierung
Jafari, A., Christensen, F. E., Massahi, S., Svendsen, S., Vu, L. M., Henriksen, P. L., Shortt, B., Krumrey, M., Cibik, L., Handick, E., & Ferreira, D. D. M. (2019). X-ray reflectometry of a platinum coating as reference sample for the ATHENA coating development. Optics for EUV, X-Ray, and Gamma-Ray Astronomy IX, San Diego, California, 13-15, August, 2019, United States of America. https://doi.org/10.1117/12.2527557