| Zugriffsnummer | 42940 |
| Dokumenttyp | Konferenzartikel |
| Peer Review | unbekannt |
| Sprache | Englisch |
| Titel | Artifact characterization for accurate TDS measurements |
| Autor(in); Institution |
Steiger, Andreas; 7.3, Detektorradiometrie und Strahlungsthermometrie, PTB-Berlin
Kehrt, Mathias; 7.3, Detektorradiometrie und Strahlungsthermometrie, PTB-Berlin
Deninger, Anselm; TOPTICA Photonics AG, Gräfeling, GERMANY
|
| Quelle/Jahr | Proceedings: Topical Meeting on Terahertz Science & Technology:(2018), 72 - 73 |
| Herausgeber(in) |
European Optical Society
|
| ISBN | 978-952-68553-5-6 (pdf) |
| Verlag | Joensuu, Finnland: European Optical Society |
| Konferenzangaben | EOS Topical Meeting on Terahertz Science & Technology (TST 2018), Berlin, 06-09, May, 2018, GERMANY |
| Zusammenfassung | The accuracy of transmission (T ) and reflection (R) measurements with THz-TDS can be determined by using artifacts. We present an artifact that exploits the wavelengthindependent properties of a thin-film pyroelectric THz detector with special electrodes. Each artifact is characterized at PTB and will be made available to customers. |
