| Zugriffsnummer | 42436 |
| Dokumenttyp | Konferenzartikel |
| Peer Review | unbekannt |
| Sprache | Englisch |
| Titel | Analysis of key comparisons with two reference standards: extended random effects meta-analysis |
| Autor(in); Institution |
Bodnar, Olha; 8.4, Mathematische Modellierung und Datenanalyse, PTB-Berlin
Elster, Clemens; 8.4, Mathematische Modellierung und Datenanalyse, PTB-Berlin
|
| Quelle/Jahr | Advanced Mathematical and Computational Tools in Metrology and Testing XI:(2018), 1 - 8 |
| Schriftenreihe | Series on advances in mathematics for applied sciences: 89 |
| Herausgeber(in) |
Forbes, Alistair B.; National Physical Laboratory, Teddington, UK
Eichstädt, Sascha; PSt, Präsidialer Stab, PTB-Braunschweig
|
| ISBN | 978-981-3274-29-7 ; 978-981-3274-31-0 |
| Verlag | New Jersey: World Scientific Publishing |
| Konferenzangaben | AMCTM - Advanced Mathematical and Computational Tools in Metrology and Testing XI, Glasgow, 29-31, August, 2017, United Kingdom |
| Freie Schlagworte | extended random effects model ; two transfer standards ; reference analysis ; CCM.M-K7 |
| Zusammenfassung | We propose a statistical method for analyzing key comparisons with two transfer standards measured in two petals. The new approach is based on an extension of the established random effects model. A full Bayesian analysis based on the reference prior is developed and analytic expressions for the results are derived. One benefit of the suggested approach is that it provides a comprehenseive assessment of the laboratory biases in terms of their posterior distributions. Another advantage is that it can easily be applied in pracice. The approach is illustrated for the CCM.M-K7 key comparison model. |
