Zugriffsnummer 42123
Dokumenttyp Zeitschriftenartikel Open Access Hybrid
Peer Review mit Peer Review
Sprache Englisch
Titel Traceability of form measurements of freeform surfaces: metrological reference surfaces
Autor(in); Institution
Fortmeier, Ines; 4.2, Bild- und Wellenoptik, PTB-Braunschweig
Schulz, Michael; 4.2, Bild- und Wellenoptik, PTB-Braunschweig
Meeß, Rudolf; 5.5, Wissenschaftlicher Gerätebau, PTB-Braunschweig
Quelle/Jahr Optical Engineering: 58 (2019), 9, 1 - 7
Artikelnummer 092602
ISSN 0091-3286 (print) ; 1560-2303 (online)
DOI
Verlag Bellingham, Wash.: SPIE
Freie Schlagworte metrology ; freeform ; reference artifact ; traceability ; interferometry ; measurement comparison
Zusammenfassung Due to the complexity of measurement systems for asphere and freeform surfaces, well-known artifacts are required to characterize the accuracy of the results of their form measurements. We present advancements in manufacturing and characterization of metrological multispherical freeform artifacts. The strong cooperation between the manufacturing and measurement units of Physikalisch-Technische Bundesanstalt (PTB) allows the form of the artifacts to be manufactured very accurately and the root-mean-square deviation from the desired design form to be improved by a factor of >20 compared to former results (e.g., from a value >500  nm to about 20 nm). Furthermore, a nickel/phosphorous coating is added to the copper surface, resulting in greater hardness and allowing the coated surface to be used as a reference for low-force tactile measurement systems. Four Gaussian peak fiducial marker structures are added to the design to improve the evaluation of comparison measurements. In addition to characterizing the radii in the spherical segments using PTB's radius measurement bench, we also characterize the sphericity of the spherical segments using a Fizeau interferometer. We show form measurement results for a full-field measuring tilted-wave interferometer and compare the form measurement results in the spherical segments with measurement results obtained with the Fizeau interferometer.
Kostenfreier Zugang Open Access Hybrid
Rechteinformation CC BY 4.0 ; Creative Commons Attribution 4.0 License ; Unported License
Forschungsprojekt 15SIB01: FreeFORM: Reference algorithms and metrology on aspherical and freeform lenses
Förderinformationen (1) Förderername: European Commission (EC)
Förderer ID: 0000 0001 2242 8989
Förderer ID Typ: ISNI
Förderprogramm: EMPIR 2015 SI Broader Scope
Titel der Förderung: 15SIB01: FreeFORM: Reference algorithms and metrology on aspherical and freeform lenses
Förderungsnummer: 15SIB01

Zitierung

Fortmeier, I., Schulz, M., & Meeß, R. (2019). Traceability of form measurements of freeform surfaces: metrological reference surfaces. Optical Engineering, 58(9), 1–7. https://doi.org/10.1117/1.oe.58.9.092602

Exportieren

PTB-Publica Menü

Sprache wechseln: uk flag