| Zugriffsnummer | 41829 |
| Dokumenttyp | Konferenzartikel |
| Peer Review | unbekannt |
| Sprache | Englisch |
| Titel | On-Wafer residual error correction through adaptive filtering of verification line measurements |
| Autor(in); Institution |
Arz, Uwe; 2.2, Hochfrequenz und Felder, PTB-Braunschweig
Savin, Aleksandr; Tomsk State University of Control Systems and Radioelectronics, Tomsk, RUSSIA
|
| Quelle/Jahr | 2018 International Workshop on Computing, Electromagnetics, and Machine Intelligence (CEMi):(2019), 79 - 80 |
| ISBN | 978-1-5386-7845-9 (PDF) ; 978-1-5386-7846-6 (PoD) |
| DOI | |
| Verlag | Piscataway, NJ: IEEE |
| Konferenzangaben | 2018 International Workshop on Computing, Electromagnetics, and Machine Intelligence (CEMi), Stellenbosch, 21-24, November, 2018, South Africa |
| Freie Schlagworte | Calibration ; Transmission line measurements ; Standards ; Error correction ; Microwave measurement ; Frequency measurement ; Measurement uncertainty |
| Zusammenfassung | In this paper we compare the performance of a residual error correction algorithm against the performance of its predecessor and investigate its ability to second-order correct on-wafer calibrations which are widely used in industry. Independent of the calibration standard definition and the calibration method used, consistent results are obtained after applying the residual error correction. |
| Themenbereich der Metrologie | Elektrizität und Magnetismus |
| Forschungsprojekt | 14IND02: PlanarCal: Microwave measurements for planar circuits and components |
| Förderinformationen (1) |
Förderername: European Commission (EC)
Förderer ID: 0000 0001 2242 8989 Förderer ID Typ: ISNI Förderprogramm: EMPIR 2014 Industry Titel der Förderung: 14IND02: PlanarCal: Microwave measurements for planar circuits and components Förderungsnummer: 14IND02 URI der Förderung: http://planarcal.ptb.de/ |
Zitierung
Arz, U. & Savin, A. (2019). On-Wafer residual error correction through adaptive filtering of verification line measurements. 2018 International Workshop on Computing, Electromagnetics, and Machine Intelligence (CEMi), Stellenbosch, 21-24, November, 2018, South Africa. https://doi.org/10.1109/cemi.2018.8610566