| Zugriffsnummer | 41810 |
| Dokumenttyp | Konferenzartikel |
| Peer Review | unbekannt |
| Sprache | Englisch |
| Titel | Improved SMD-based capacitance standards |
| Autor(in); Institution |
Schurr, Jürgen; 2.6, Elektrische Quantenmetrologie, PTB-Braunschweig
Lee, Jinni; 2.6, Elektrische Quantenmetrologie, PTB-Braunschweig
Bürkel, Veit; 2.6, Elektrische Quantenmetrologie, PTB-Braunschweig
|
| Quelle/Jahr | CPEM 2018, Conference on Precision Electromagnetic Measurements: conference digest:(2018), 740 - 741 |
| Artikelnummer | S077-12-1801150828 |
| Availability | [USB-stick] |
| ISSN | 2160-0171 (ONLINE) ; 0589-1485 (POD) |
| ISBN | 978-1-5386-0974-3 (PDF) ; 978-1-5386-0973-6 (USB) ; 978-1-5386-2130-1 (PoD) |
| DOI | |
| Verlag | New York, NY: IEEE |
| Konferenzangaben | Conference on Precision Electromagnetic Measurements ; CPEM 2018, Paris, 08-13, July, 2018, France |
| Freie Schlagworte | SMD capacitor ; capacitance standard |
| Zusammenfassung | We have developed improved SMD-based capacitance standards of a nominal value of 10 nF. Other values in a wide range are also possible. The standards feature a small relative deviation from nominal (less than 10×10-6), a low dissipation factor (less than 5×10-6), and a small temperature coefficient (0.5×10-6/K) which strongly reduces the requirements for temperature control. Here, we report on the design and the assembly procedure. |
| Themenbereich der Metrologie | Elektrizität und Magnetismus |