Zugriffsnummer 41801
Dokumenttyp Konferenzartikel
Peer Review unbekannt
Sprache Englisch
Titel A reference material for accurate THz measurements
Autor(in); Institution
Steiger, Andreas; 7.3, Detektorradiometrie und Strahlungsthermometrie, PTB-Berlin
Kehrt, Mathias; 7.3, Detektorradiometrie und Strahlungsthermometrie, PTB-Berlin
Deninger, Anselm; TOPTICA Photonics AG, Gräfeling, GERMANY
Quelle/Jahr 2018 43rd International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz) IEEE Xplore:(2018), 2 S.
Artikelnummer 18260670
Availability [online only]
ISSN 2162-2035 (ONLINE) ; 2162-2027 (POD)
ISBN 978-1-5386-3809-5 (online) ; 978-1-5386-3808-8 (USB) ; 978-1-5386-3810-1 (PoD)
DOI
Verlag Piscataway, NJ: IEEE
Konferenzangaben IRMMW-THz 2018; 2018, 43rd International Conference on Infrared, Milimeter and Terahertz-Waves, Nagoya, 09-14, September, 2018, Japan
Freie Schlagworte detectors ; power measurement ; atmospheric measurements ; particle measurements ; laser beams ; measurements by laser beam ; reflection ; submillimetre wave measurement ; terahertz materials ; transmission measurements ; accurate THz measurements ; reflection measurements ; reference material
Zusammenfassung Thz technology has proven a valuable tool both in fundamental research and practical applications, including diagnostics, measurements and testing. Well-known advantages include the ease of use of non-ionizing radiation, a better spatial resolution than radio waves, and the possibility of performing non-contact measurements in optically opaque dielectric materials like foams, adhesives, glass fiber mats or plastics and composites. THz imaging and thickness profilometry enable the inspection of non-conducting compound materials, including surface varnishing or foam coatings of thermal insulators. In particular, time-domain spectroscopy (THz-TDS) has become widely used in science and, increasingly, also in industrial applications for nondestructive testing in either reflection (R) or transmission (T). However, a recent international intercomparison of TDS transmission measurements, which involved 18 academic and industrial participants, demonstrated a high variability of measurement outcomes from a set of identical samples. Moreover, measurements in reflection geometry are even more challenging, but are mandatory in many industrial settings. For both R+T measurements, a certified reference material is highly desirable. The development of such an artifact is the goal of a joint R&D project of PTB and TOPTICA.
Themenbereich der Metrologie Photometrie und Radiometrie
Forschungsprojekt TransMET

Zitierung

Steiger, A., Kehrt, M., & Deninger, A. (2018). A reference material for accurate THz measurements. IRMMW-THz 2018; 2018, 43rd International Conference on Infrared, Milimeter and Terahertz-Waves, Nagoya, 09-14, September, 2018, Japan. https://doi.org/10.1109/irmmw-thz.2018.8510011

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