Zugriffsnummer 41585
Dokumenttyp Zeitschriftenartikel
Peer Review mit Peer Review
Sprache Englisch
Titel Hall effect and resistivity in epitaxial MnSi thin films under ambient and high pressure
Autor(in); Institution
Menzel, D.; Technische Universität Braunschweig, Institut für Physik der Kondensierten Materie, Braunschweig, GERMANY
Schröter, D.; Technische Universität Braunschweig, Institut für Physik der Kondensierten Materie, Braunschweig, GERMANY
Steinki, N.; Technische Universität Braunschweig, Institut für Physik der Kondensierten Materie, Braunschweig, GERMANY
Süllow, S.; Technische Universität Braunschweig, Institut für Physik der Kondensierten Materie, Braunschweig, GERMANY
Fernández Scarioni, Alexander; 2.5, Halbleiterphysik und Magnetismus, PTB-Braunschweig
Schumacher, Hans Werner; 2.5, Halbleiterphysik und Magnetismus, PTB-Braunschweig
Okuyama, H.; Hokkaido University, Graduate School of Science, Sapporo, JAPAN
Hidaka, H.; Hokkaido University, Graduate School of Science, Sapporo, JAPAN
Amitsuka, H.; Hokkaido University, Graduate School of Science, Sapporo, JAPAN
Quelle/Jahr IEEE Transactions on Magnetics: 55 (2019), 2, 1 - 4
Artikelnummer 1500204
ISSN 0018-9464 (PRINT) ; 1941-0069 (ONLINE)
DOI
Verlag New York, NY: IEEE
Freie Schlagworte Hall effect ; hydrostatic pressure ; magnetoresistance ; skyrmions
Zusammenfassung Thin film MnSi has been epitaxially grown on Si(111) substrate and investigated in terms of magnetoresistance and Hall measurements under applied hydrostatic pressure up to 2.58 GPa. Although the behavior of the thin films is qualitatively similar to bulk material, at a high pressure above 2 GPa, an additional magnetic ordering occurs, resulting in a reduction of the potential scattering by spin fluctuations. This ordering is stabilized at the applied pressure showing visible effects in the magnetotransport data. Comparing the behavior of thin films with the bulk material under pressure, it seems quite likely that this additional ordering is of skyrmionic nature, which has as yet not been unambiguously evidenced in epitaxial B20 thin films on a substrate under ambient pressure.
Themenbereich der Metrologie Elektrizität und Magnetismus

Zitierung

Menzel, D., Schröter, D., Steinki, N., Süllow, S., Fernández Scarioni, A., Schumacher, H. W., Okuyama, H., Hidaka, H., & Amitsuka, H. (2019). Hall effect and resistivity in epitaxial MnSi thin films under ambient and high pressure. IEEE Transactions on Magnetics, 55(2), 1–4. https://doi.org/10.1109/tmag.2018.2864095

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