| Zugriffsnummer | 41390 |
| Dokumenttyp | Konferenzartikel |
| Peer Review | unbekannt |
| Sprache | Englisch |
| Titel | Planar multijunction thermal converters with increased sensitivity operated in hermetically sealed housings filled with noble gas |
| Autor(in); Institution |
Funck, Torsten; 2.1, Gleichstrom und Niederfrequenz, PTB-Braunschweig
Spiegel, Thomas; 2.1, Gleichstrom und Niederfrequenz, PTB-Braunschweig
Ihring, Andreas; Leibniz-Institut für Photonische Technologien e.V., Jena, GERMANY
|
| Quelle/Jahr | 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018), Full Digest:(2018), 421 - 422 |
| Artikelnummer | S540-10 |
| Availability | [USB-Stick] ; file name: CPEM-S540-10-1803011459.pdf |
| ISSN | 2160-0171 (ELECTRONIC) ; 0589-1485 (POD) |
| ISBN | 978-1-5386-0974-3 (PDF) ; 978-1-5386-0973-6 (USB) ; 978-1-5386-2130-1 (PoD) |
| DOI | |
| Verlag | Piscataway, NJ: IEEE |
| Konferenzangaben | Conference on Precision Electromagnetic Measurements (CPEM), Paris, 08-13, July, 2018, France |
| Freie Schlagworte | AC-DC transfer ; thermal converter ; noble gas ; housing ; krypton ; sensitivity ; xenon |
| Zusammenfassung | The sensitivity of planar multijunction thermal converters (PMJTCs) was significantly increased by filling the housing with noble gases, preferably xenon or krypton. The performance was observed for more than one year and no degradation of sensitivity was found. Also the frequency response of the AC-DC transfer difference remains unchanged at high frequencies and even improves below 40 Hz. Using the lowest at present manufacturable heater resistance of 90 Ω with the noble gas filling, AC-DC transfer down to less than 70 mV compared to about 100 mV in air becomes possible. |
| Themenbereich der Metrologie | Elektrizität und Magnetismus |
Zitierung
Funck, T., Spiegel, T., & Ihring, A. (2018). Planar multijunction thermal converters with increased sensitivity operated in hermetically sealed housings filled with noble gas. Conference on Precision Electromagnetic Measurements (CPEM), Paris, 08-13, July, 2018, France. https://doi.org/10.1109/cpem.2018.8500814