| Zugriffsnummer | 41347 |
| Dokumenttyp | Konferenzartikel |
| Peer Review | unbekannt |
| Sprache | Englisch |
| Titel | Calibration of an inductive voltage divider using pulse-driven Josephson arrays |
| Autor(in); Institution |
Herick, Jonas; 2.6, Elektrische Quantenmetrologie, PTB-Braunschweig
Bauer, Stephan; 2.6, Elektrische Quantenmetrologie, PTB-Braunschweig
Behr, Ralf; 2.6, Elektrische Quantenmetrologie, PTB-Braunschweig
Beug, Marc Florian; 2.1, Gleichstrom und Niederfrequenz, PTB-Braunschweig
Kieler, Oliver; 2.4, Quantenelektronik, PTB-Braunschweig
Palafox Gamir, Luis; 2.6, Elektrische Quantenmetrologie, PTB-Braunschweig
|
| Quelle/Jahr | 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018), Full Digest:(2018), 583 - 584 |
| ISSN | 2160-0171 (ELECTRONIC) ; 0589-1485 (POD) |
| ISBN | 978-1-5386-0974-3 (PDF) ; 978-1-5386-0973-6 (USB) ; 978-1-5386-2130-1 (PoD) |
| DOI | |
| Verlag | Piscataway, NJ: IEEE |
| Konferenzangaben | Conference on Precision Electromagnetic Measurements ; CPEM 2018, Paris, 08-13, July, 2018, France |
| Freie Schlagworte | Josephson standard ; pulse-driven Josephson arrays ; inductive voltage divider ; measurement techniques ; precision measurements |
| Zusammenfassung | We present a method for the voltage ratio calibration of inductive voltage dividers using quantum accurate pulse-driven Josephson standards. The inductive voltage divider calibration is carried out at 497 Hz with RMS amplitudes of 40 mV and 100 mV and is compared with conventional bootstrapping calibrations performed at 1 V. In these preliminary measurements, the new calibration method reached similar in-phase uncertainties as the bootstrapping method, despite the large difference in input voltages. |
| Themenbereich der Metrologie | Elektrizität und Magnetismus |
Zitierung
Herick, J., Bauer, S., Behr, R., Beug, M. F., Kieler, O., & Palafox Gamir, L. (2018). Calibration of an inductive voltage divider using pulse-driven Josephson arrays. Conference on Precision Electromagnetic Measurements ; CPEM 2018, Paris, 08-13, July, 2018, France. https://doi.org/10.1109/cpem.2018.8500789