| Zugriffsnummer | 41260 |
| Dokumenttyp | Konferenzartikel |
| Peer Review | unbekannt |
| Sprache | Englisch |
| Titel | Development and fabrication of improved Josephson series arrays with NbSi barrier for AC voltage standards |
| Autor(in); Institution |
Kohlmann, Johannes; 2.4, Quantenelektronik, PTB-Braunschweig
Kieler, Oliver; 2.4, Quantenelektronik, PTB-Braunschweig
Tian, Hao; 2.4, Quantenelektronik, PTB-Braunschweig
Wendisch, Rüdiger; 2.4, Quantenelektronik, PTB-Braunschweig
Egeling, Bert; 2.4, Quantenelektronik, PTB-Braunschweig
Behr, Ralf; 2.6, Elektrische Quantenmetrologie, PTB-Braunschweig
|
| Quelle/Jahr | 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018), Full Digest:(2018), 381 - 382 |
| ISSN | 2160-0171 (ELECTRONIC) ; 0589-1485 (POD) |
| ISBN | 978-1-5386-0974-3 (PDF) ; 978-1-5386-0973-6 (USB) ; 978-1-5386-2130-1 (PoD) |
| DOI | |
| Verlag | Piscataway, NJ: IEEE |
| Konferenzangaben | Conference on Precision Electromagnetic Measurements ; CPEM 2018, Paris, 08-13, July, 2018, France |
| Freie Schlagworte | AC Josephson voltage standards ; binary-divided Josephson series arrays ; NbSi barrier Josephson junctions ; pulse-driven Josephson series arrays ; SNS Josephson junctions |
| Zusammenfassung | Series arrays of overdamped Josephson junctions compose the basis of AC Josephson voltage standards. Presently, the most reliable technology is based on Josephson junctions containing an NbxSi1-x barrier. Using junction stacks containing five Josephson junctions, series arrays of 15,000 junctions have been successfully fabricated at PTB for the pulse-driven Josephson Arbitrary Waveform Synthesizer. The operation of eight arrays simultaneously enable spectrally pure waveforms with output voltages above 1 V to be synthesized. |
| Themenbereich der Metrologie | Elektrizität und Magnetismus |
Zitierung
Kohlmann, J., Kieler, O., Tian, H., Wendisch, R., Egeling, B., & Behr, R. (2018). Development and fabrication of improved Josephson series arrays with NbSi barrier for AC voltage standards. Conference on Precision Electromagnetic Measurements ; CPEM 2018, Paris, 08-13, July, 2018, France. https://doi.org/10.1109/cpem.2018.8500887