Zugriffsnummer 40824
Dokumenttyp Konferenzartikel
Peer Review unbekannt
Sprache Englisch
Titel Length, time, and frequency metrology with dual frequency combs
Autor(in); Institution
Beha, Katja; Menlo Systems GmbH, Martinsried, GERMANY
Hänsel, Wolfgang; Menlo Systems GmbH, Martinsried, GERMANY
Giunta, Michele; Menlo Systems GmbH, Martinsried, GERMANY; Max Planck Institute of Quantum Optics, Garching, GERMANY
Pollinger, Florian; 5.4, Interferometrie an Maßverkörperungen, PTB-Braunschweig
Meyer, Tobias; 5.4, Interferometrie an Maßverkörperungen, PTB-Braunschweig
Angermüller, Ullrich; Menlo Systems GmbH, Martinsried, GERMANY
Lezius, Matthias; Menlo Systems GmbH, Martinsried, GERMANY
Holzwarth, Ronald; Menlo Systems GmbH, Martinsried, GERMANY
Quelle/Jahr Conference on Lasers and Electro-Optics, OSA Technical Digest (online):(2018), 1 - 2
ISBN 978-1-943580-42-2 (PDF) ; 978-1-5386-5733-1 (PoD)
DOI
Verlag Washington, DC: OSA
Konferenzangaben CLEO Conference 2018, San Jose, Calif., 13-18, May, 2018, USA
Klassifikationscode OCIS: 120.3940 ; OCIS: 300.6320
Freie Schlagworte Metrology ; Spectroscopy ; High-resolution ; long distance measurement ; frequency comb
Zusammenfassung We present two applications of dual-comb spectroscopy: Real-time precision ranging and high-resolution spectroscopy of acetylene. The measurement system consists of two ultra-low noise optical frequency combs.
Themenbereich der Metrologie Länge, dimensionelle Metrologie

Zitierung

Beha, K., Hänsel, W., Giunta, M., Pollinger, F., Meyer, T., Angermüller, U., Lezius, M., & Holzwarth, R. (2018). Length, time, and frequency metrology with dual frequency combs. CLEO Conference 2018, San Jose, Calif., 13-18, May, 2018, USA. https://doi.org/10.1364/cleo_si.2018.sw4l.1

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