| Zugriffsnummer | 40754 |
| Dokumenttyp | Konferenzartikel |
| Peer Review | unbekannt |
| Sprache | Englisch |
| Titel | Quantitative surface characterization of silicon spheres by combined X-ray fluorescence analysis and X-ray photoelectron spectroscopy measurements |
| Autor(in); Institution |
Beyer, Edyta; 1.8, Masse - Darstellung der Einheit, PTB-Braunschweig
Kolbe, Michael; 7.1, Radiometrie mit Synchrotronstrahlung, PTB-Berlin
Müller, Matthias; 7.1, Radiometrie mit Synchrotronstrahlung, PTB-Berlin
|
| Quelle/Jahr | 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018):(2018), 1 - 2 |
| ISBN | 978-1-5386-0974-3 ; 978-1-5386-0973-6 (USB) |
| DOI | |
| Verlag | Piscataway, NJ: IEEE |
| Konferenzangaben | Conference on Precision Electromagnetic Measurements - CPEM 2018, Paris, 08-13, July, 2018, France |
| Freie Schlagworte | Avogadro constant ; measurement standards ; measurement technique ; surface characterization ; spectroscopy |
| Zusammenfassung | The future realization of the kilogram as the SI base unit of mass, by monocrystalline enriched 28Si-spheres requires a reliable surface analysis of silicon spheres. An analytical instrument with complementary spectroscopic techniques is used for a quantitative surface characterization of such spheres. In particular, the mass deposition and the composition of the surface layer are measured. The presented principles of the quantification combine X-ray fluorescence spectroscopy (XRF) and X-ray photoelectron spectroscopy (XPS) results. |
Zitierung
Beyer, E., Kolbe, M., & Müller, M. (2018). Quantitative surface characterization of silicon spheres by combined X-ray fluorescence analysis and X-ray photoelectron spectroscopy measurements. Conference on Precision Electromagnetic Measurements - CPEM 2018, Paris, 08-13, July, 2018, France. https://doi.org/10.1109/cpem.2018.8501131